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Volumn 85, Issue 21, 2004, Pages 5013-5015

Interface-oxygen-loss-controlled voltage offsets in epitaxial Pb (Zr0.52 Ti0.48) O3 thin-film capacitors with La0.7 Sr0.3 Mn O3 electrodes

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRIC FIELDS; ELECTRODES; EPITAXIAL GROWTH; FERROELECTRIC DEVICES; FERROELECTRICITY; HYSTERESIS; LEAD ALLOYS; LOW TEMPERATURE EFFECTS; PHASE TRANSITIONS; PULSED LASER DEPOSITION; THIN FILM DEVICES;

EID: 19144366885     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1827929     Document Type: Article
Times cited : (35)

References (22)
  • 15
    • 0003183869 scopus 로고    scopus 로고
    • 0021-8979 10.1063/1.366064
    • Y. M. Kang and S. Baik, J. Appl. Phys. 0021-8979 10.1063/1.366064 82, 2532 (1997);
    • (1997) J. Appl. Phys. , vol.82 , pp. 2532
    • Kang, Y.M.1    Baik, S.2
  • 16
    • 0001395416 scopus 로고    scopus 로고
    • 0021-8979 10.1063/1.369195
    • K. S. Lee and S. Baik, J. Appl. Phys. 0021-8979 10.1063/1.369195 85, 1995 (1999);
    • (1999) J. Appl. Phys. , vol.85 , pp. 1995
    • Lee, K.S.1    Baik, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.