Measurement of interface trap states in metal-ferroelectric-silicon heterostructures

Applied Physics Letters

Volumn 72, Issue 18, 1998, Pages 2283-2285

  Alexe, Marin ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001462362     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121337     Document Type: Article

References (17)

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