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Volumn 106, Issue 8, 2009, Pages

Polarization direction and stability in ferroelectric lead titanate thin films

Author keywords

[No Author keywords available]

Indexed keywords

AS-GROWN; BOTTOM ELECTRODES; CHARGED DEFECTS; FILMS THINNER; LEAD TITANATE THIN FILMS; POLARIZATION DIRECTION; TOP SURFACE; VERY THIN FILMS;

EID: 70350741021     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3240331     Document Type: Article
Times cited : (26)

References (34)
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  • 12
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    • Chynoweth, A.G.1
  • 18
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    • 2 F were taken from Ref
    • 2 F were taken from Ref.
  • 20
    • 70350737315 scopus 로고    scopus 로고
    • e
    • e.
  • 22
    • 70350727887 scopus 로고    scopus 로고
    • 4 ≈-4.42563× 10-6. With these four terms, the expansion is accurate uto ≈7 (Ref.).
    • 4 ≈-4.42563× 10-6. With these four terms, the expansion is accurate up to ≈7 (Ref.).
  • 23
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    • The screening length was set at 0.11 nm and the relative dielectric constant at 8.45 (Ref.).
    • The screening length was set at 0.11 nm and the relative dielectric constant at 8.45 (Ref.).
  • 26
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    • Schottky barrier heights of tantalum oxide, barium strontium titanate, lead titanate, and strontium bismuth tantalate
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  • 33
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    • Nature of nonlinear imprint in ferroelectric films and long-term prediction of polarization loss in ferroelectric memories
    • DOI 10.1063/1.1805190
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.