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Volumn 54, Issue 24, 1996, Pages 17877-17883

Bias-dependent imaging of the In-terminated InAs(001) surface by STM: Reconstruction and transitional defect

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EID: 0001514630     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.54.17877     Document Type: Article
Times cited : (72)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.