Direct comparison of photoemission spectroscopy and in situ Kelvin probe work function measurements on indium tin oxide films

Journal of Electron Spectroscopy and Related Phenomena

Volumn 152, Issue 1-2, 2006, Pages 12-17

  Beerbom, M M ^a   Lagel B ^a   Cascio, A J ^a   Doran, B V ^a   Schlaf, R ^a  

^a University of South Florida   (United States)

Author keywords

ITO; Kelvin probe; Photoemission spectroscopy; Work function

Indexed keywords

CLEANING; INDIUM COMPOUNDS; PHOTOCHEMICAL REACTIONS; PHOTOEMISSION; PROBES; ULTRAHIGH VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY;

ITO; KELVIN PROBE; PHOTOEMISSION SPECTROSCOPY; WORK FUNCTION;

TIN COMPOUNDS;

EID: 33747141772     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2006.02.001     Document Type: Article

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