메뉴 건너뛰기




Volumn 132, Issue 3, 2010, Pages 0309091-0309099

Tip based nanomanipulation through successive directional push

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MICROMANIPULATORS; TOPOGRAPHY;

EID: 77955317488     PISSN: 10871357     EISSN: 15288935     Source Type: Journal    
DOI: 10.1115/1.4001676     Document Type: Article
Times cited : (14)

References (27)
  • 1
    • 0032606854 scopus 로고    scopus 로고
    • Mechanical tuning of tunnel gaps for the assembly of single-electron transistors
    • Carlsson, S. B., Junno, T., Montelius, L., and Samuelson, L., 1999, "Mechanical Tuning of Tunnel Gaps for the Assembly of Single-Electron Transistors," Appl. Phys. Lett., 75, pp. 1461-1463.
    • (1999) Appl. Phys. Lett. , vol.75 , pp. 1461-1463
    • Carlsson, S.B.1    Junno, T.2    Montelius, L.3    Samuelson, L.4
  • 2
    • 0037868904 scopus 로고    scopus 로고
    • Local detection of electromagnetic energy transport below the diffraction limit in metal nanoparticle plasmon waveguides
    • Maier, S. A., Kik, P. G., Atwater, H. A., Meltzer, S., Harel, E., Koel, B. E., and Requicha, A. A. G., 2003, "Local Detection of Electromagnetic Energy Transport Below the Diffraction Limit in Metal Nanoparticle Plasmon Waveguides," Nature Mater., 2, pp. 229-232.
    • (2003) Nature Mater. , vol.2 , pp. 229-232
    • Maier, S.A.1    Kik, P.G.2    Atwater, H.A.3    Meltzer, S.4    Harel, E.5    Koel, B.E.6    Requicha, A.A.G.7
  • 3
    • 33746440680 scopus 로고    scopus 로고
    • Drift compensation for automatic nanomanipulation with scanning probe microscopes
    • Mokaberi, B., and Requicha, A. A. G., 2006, "Drift Compensation for Automatic Nanomanipulation With Scanning Probe Microscopes," IEEE. Trans. Autom. Sci. Eng., 3(3), pp. 199-207.
    • (2006) IEEE. Trans. Autom. Sci. Eng. , vol.3 , Issue.3 , pp. 199-207
    • Mokaberi, B.1    Requicha, A.A.G.2
  • 4
    • 0034318774 scopus 로고    scopus 로고
    • Atomic force microscopy-based nanolithography on silicon using colloidal au nanoparticles as a nanooxidation mask
    • Zheng, J., Chen, Z., and Liu, Z., 2000, "Atomic Force Microscopy-Based Nanolithography on Silicon Using Colloidal Au Nanoparticles as a Nanooxidation Mask," Langmuir, 16(24), pp. 9673-9676.
    • (2000) Langmuir , vol.16 , Issue.24 , pp. 9673-9676
    • Zheng, J.1    Chen, Z.2    Liu, Z.3
  • 6
    • 0012986514 scopus 로고    scopus 로고
    • Atomic force microscope-based data storage: Track servo and wear study
    • Berlin
    • Terris, B. D., and Rishton, S. A., 1998, "Atomic Force Microscope-Based Data Storage: Track Servo and Wear Study," Appl. Phys. (Berlin), 66, pp. 809-813.
    • (1998) Appl. Phys. , vol.66 , pp. 809-813
    • Terris, B.D.1    Rishton, S.A.2
  • 7
    • 0036005859 scopus 로고    scopus 로고
    • Imaging and manipulation of biological structures with the AFM
    • Fotiadis, D., Scheuring, S., Müller, S. A., Engel, A., and Muller, D. J., 2002, "Imaging and Manipulation of Biological Structures With the AFM," Micron, 33, pp. 385-397.
    • (2002) Micron , vol.33 , pp. 385-397
    • Fotiadis, D.1    Scheuring, S.2    Müller, S.A.3    Engel, A.4    Muller, D.J.5
  • 8
    • 7444226887 scopus 로고    scopus 로고
    • Electronic manipulation of DNA, proteins and nanoparticles for potential circuit assembly
    • Zheng, L., Brody, J. P., and Burke, P. J., 2004, "Electronic Manipulation of DNA, Proteins and Nanoparticles for Potential Circuit Assembly," Biosens. Bioelectron., 20, pp. 606-619.
    • (2004) Biosens. Bioelectron. , vol.20 , pp. 606-619
    • Zheng, L.1    Brody, J.P.2    Burke, P.J.3
  • 9
    • 8844276061 scopus 로고    scopus 로고
    • Nanomanipulation of extended single-DNA molecules on modified mica surfaces using the atomic force microscopy
    • Lu, J. H., 2004, "Nanomanipulation of Extended Single-DNA Molecules on Modified Mica Surfaces Using the Atomic Force Microscopy," Colloids Surf., B, 39, pp. 177-180.
    • (2004) Colloids Surf. B , vol.39 , pp. 177-180
    • Lu, J.H.1
  • 10
    • 70350698600 scopus 로고    scopus 로고
    • Nanomanipulation with the atomic force microscope
    • Information Technology, Wiley, Weinheim
    • Requicha, A. A. G., 2008, "Nanomanipulation With the Atomic Force Microscope," Nanotechnology, Volume 3: Information Technology, Wiley, Weinheim.
    • (2008) Nanotechnology , vol.3
    • Requicha, A.A.G.1
  • 11
    • 36449009033 scopus 로고
    • Fabrication of two-dimensional arrays of nanometer-size clusters with the atomic force microscope
    • Schaefer, D. M., Reifenberger, R., Patil, A., and Andres, R. P., 1995, "Fabrication of Two-Dimensional Arrays of Nanometer-Size Clusters With the Atomic Force Microscope," Appl. Phys. Lett., 66, pp. 1012-1014.
    • (1995) Appl. Phys. Lett. , vol.66 , pp. 1012-1014
    • Schaefer, D.M.1    Reifenberger, R.2    Patil, A.3    Andres, R.P.4
  • 12
    • 0001075932 scopus 로고    scopus 로고
    • Nanotribology and nanofabrication of MoO3 structures by atomic force microscopy
    • Sheehan, P. E., and Lieber, C. M., 1996, "Nanotribology and Nanofabrication of MoO3 Structures by Atomic Force Microscopy," Science, 272(5265), pp. 1158-1161.
    • (1996) Science , vol.272 , Issue.5265 , pp. 1158-1161
    • Sheehan, P.E.1    Lieber, C.M.2
  • 13
    • 0034205024 scopus 로고    scopus 로고
    • Controlled manipulation of molecular samples with the nanomanipulator
    • Guthold, M., Falvo, M. R., Matthews, W. G., and Paulson, S., 2000, "Controlled Manipulation of Molecular Samples With the Nanomanipulator, " IEEE/ ASME Trans. Mechatron., 5(2), pp. 189-198.
    • (2000) IEEE/ ASME Trans. Mechatron. , vol.5 , Issue.2 , pp. 189-198
    • Guthold, M.1    Falvo, M.R.2    Matthews, W.G.3    Paulson, S.4
  • 14
    • 0034205494 scopus 로고    scopus 로고
    • Controlled pushing of nanoparticles: Modeling and experiments
    • Hashimoto, H., and Sitti, M., 2000, "Controlled Pushing of Nanoparticles: Modeling and Experiments," IEEE/ASME Trans. Mechatron., 5(2), pp. 199-211.
    • (2000) IEEE/ASME Trans. Mechatron. , vol.5 , Issue.2 , pp. 199-211
    • Hashimoto, H.1    Sitti, M.2
  • 16
    • 0001997274 scopus 로고    scopus 로고
    • A technique for positioning nanoparticles using an atomic force microscope
    • Hansen, L. T., Kühle, A., Sørensen, A. H., Bohr, J., and Lindelof, P. E., 1998, "A Technique for Positioning Nanoparticles Using an Atomic Force Microscope," Nanotechnology, 9, pp. 337-342.
    • (1998) Nanotechnology , vol.9 , pp. 337-342
    • Hansen, L.T.1    Kühle, A.2    Sørensen, A.H.3    Bohr, J.4    Lindelof, P.E.5
  • 18
    • 34247533740 scopus 로고    scopus 로고
    • Nanoparticle patterns
    • Requicha, A. A. G., 1999, "Nanoparticle Patterns," J. Nanopart. Res., 1, pp. 321-323.
    • (1999) J. Nanopart. Res. , vol.1 , pp. 321-323
    • Requicha, A.A.G.1
  • 21
    • 0347654973 scopus 로고    scopus 로고
    • Atomic force microscopy nanomanipulation of silicon nanocrystals for nanodevice fabrication
    • Decossas, S., Mazen, F., Baron, T., Brmond, G., and Souifi, A., 2003, "Atomic Force Microscopy Nanomanipulation of Silicon Nanocrystals for Nanodevice Fabrication," Nanotechnology, 14, pp. 1272-1278.
    • (2003) Nanotechnology , vol.14 , pp. 1272-1278
    • Decossas, S.1    Mazen, F.2    Baron, T.3    Brmond, G.4    Souifi, A.5
  • 23
    • 3343017572 scopus 로고    scopus 로고
    • Development of augmented reality system for AFM-based nanomanipulation
    • Li, G., Xi, N., Yu, M., and Fung, W. K., 2004, "Development of Augmented Reality System for AFM-Based Nanomanipulation," IEEE/ASME Trans. Mechatron., 9, pp. 358-365.
    • (2004) IEEE/ASME Trans. Mechatron. , vol.9 , pp. 358-365
    • Li, G.1    Xi, N.2    Yu, M.3    Fung, W.K.4
  • 25
    • 33746401569 scopus 로고    scopus 로고
    • CAD-guided automated nanoassembly using atomic force microscopy-based nonrobotics
    • DOI 10.1109/TASE.2006.876907, 1650471
    • Chen, H., Xi, N., and Li, G., 2006. "CAD-Guided Automated Nanoassembly Using Atomic Force Microscopy-Based Nanorobotics," IEEE. Trans. Autom. Sci. Eng., 3, pp. 208-217. (Pubitemid 44121550)
    • (2006) IEEE Transactions on Automation Science and Engineering , vol.3 , Issue.3 , pp. 208-217
    • Chen, H.1    Xi, N.2    Li, G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.