A technique for positioning nanoparticles using an atomic force microscope

Nanotechnology

Volumn 9, Issue 4, 1998, Pages 337-342

  Theil Hansen, L ^a   Kuhle A ^b   Sorensen A H ^b   Bohr, J ^b   Lindelof, P E ^a  

^a UNIVERSITY OF COPENHAGEN   (Denmark)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE; COMPUTER SOFTWARE; MAGNETOMETERS; NANOSTRUCTURED MATERIALS; PERSONAL COMPUTERS; TWO DIMENSIONAL;

NANOPARTICLES;

ATOMIC FORCE MICROSCOPY;

EID: 0001997274     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/9/4/006     Document Type: Article

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