Drift compensation for automatic nanomanipulation with scanning probe microscopes

IEEE Transactions on Automation Science and Engineering

Volumn 3, Issue 3, 2006, Pages 199-207

  Mokaberi, Babak ^a,b   Requicha, Aristides A G ^a,b  

^a IEEE   (United States)

^b UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

Atomic force microscopes (AFMs); Kalman filtering; Nanoassembly; Nanomanipulation; Nanorobotics; Scanning probe microscopes; Spatial uncertainty

Indexed keywords

NANOASSEMBLY; NANOMANIPULATION; NANOROBOTICS; SCANNING PROBE MICROSCOPES; SPATIAL UNCERTAINTY;

ATOMIC FORCE MICROSCOPY; COMPUTATIONAL COMPLEXITY; KALMAN FILTERING; NANOTECHNOLOGY; SOFTWARE PROTOTYPING; SPATIAL VARIABLES CONTROL;

MANIPULATORS;

EID: 33746440680     PISSN: 15455955     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASE.2006.875534     Document Type: Article

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