메뉴 건너뛰기




Volumn 9, Issue 2, 2004, Pages 358-365

Development of augmented reality system for AFM-based nanomanipulation

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; COMPUTER VISION; FORCE MEASUREMENT; HAPTIC INTERFACES; MATHEMATICAL MODELS; NANOTECHNOLOGY; PHOTODIODES; REAL TIME SYSTEMS; ROBOTIC ASSEMBLY; THREE DIMENSIONAL; VIRTUAL REALITY;

EID: 3343017572     PISSN: 10834435     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMECH.2004.828651     Document Type: Article
Times cited : (228)

References (16)
  • 1
    • 0012618901 scopus 로고
    • Atomic force microscope
    • G. Binning, C. F. Quate, and C. Gerber, "Atomic force microscope," Phys. Rev. Lett., vol. 56, no. 9, pp. 930-933, 1986.
    • (1986) Phys. Rev. Lett. , vol.56 , Issue.9 , pp. 930-933
    • Binning, G.1    Quate, C.F.2    Gerber, C.3
  • 2
    • 36449009033 scopus 로고
    • Fabrication of two-dimensional arrays of nanometer-size clusters with the atomic force microscope
    • Feb
    • D. M. Schaefer, R. Reifenberger, A. Patil, and R. P. Andres, "Fabrication of two-dimensional arrays of nanometer-size clusters with the atomic force microscope," Appl. Phys. Lett., vol. 66, pp. 1012-1014, Feb. 1995.
    • (1995) Appl. Phys. Lett. , vol.66 , pp. 1012-1014
    • Schaefer, D.M.1    Reifenberger, R.2    Patil, A.3    Andres, R.P.4
  • 3
    • 34249022469 scopus 로고
    • Controlled manipulation of nanoparticles with an atomic force microscope
    • June
    • T. Junno, K. Deppert, L. Montelius, and L. Samuelson, "Controlled manipulation of nanoparticles with an atomic force microscope," Appl. Phys. Lett., vol. 66, no. 26, pp. 3627-3629, June 1995.
    • (1995) Appl. Phys. Lett. , vol.66 , Issue.26 , pp. 3627-3629
    • Junno, T.1    Deppert, K.2    Montelius, L.3    Samuelson, L.4
  • 5
    • 0001997274 scopus 로고    scopus 로고
    • A technique for positioning nanoparticles using an atomic force microscope
    • L. T. Hansen, A. Kuhle, A. H. Sorensen, J. Bohr, and P. E. Lindelof, "A technique for positioning nanoparticles using an atomic force microscope," Nanotechnology, vol. 9, pp. 337-342, 1998.
    • (1998) Nanotechnology , vol.9 , pp. 337-342
    • Hansen, L.T.1    Kuhle, A.2    Sorensen, A.H.3    Bohr, J.4    Lindelof, P.E.5
  • 8
    • 0034205494 scopus 로고    scopus 로고
    • Controlled pushing of nanoparticles: Modeling and experiments
    • June
    • M. Sitti and H. Hashimoto, "Controlled pushing of nanoparticles: Modeling and experiments," IEEE/ASME Trans. Mechatron., vol. 5, pp. 199-211, June 2000.
    • (2000) IEEE/ASME Trans. Mechatron. , vol.5 , pp. 199-211
    • Sitti, M.1    Hashimoto, H.2
  • 9
    • 36449007442 scopus 로고
    • Calibration of atomic-force microscope tips
    • J. L. Hutter and J. Bechhoefer, "Calibration of atomic-force microscope tips," Rev. Scientific Instrum., vol. 64, pp. 1868-1873, 1993.
    • (1993) Rev. Scientific Instrum. , vol.64 , pp. 1868-1873
    • Hutter, J.L.1    Bechhoefer, J.2
  • 10
    • 0027540056 scopus 로고
    • A nondestructive method for determing the spring constant of cantilevers for scanning force microscopy
    • J. P. Cleveland, S. Manne, D. Bocek, and P. K. Hansma, "A nondestructive method for determing the spring constant of cantilevers for scanning force microscopy," Rev. Scientific Instrum., vol. 64, no. 2, pp. 3967-3969, 1993.
    • (1993) Rev. Scientific Instrum. , vol.64 , Issue.2 , pp. 3967-3969
    • Cleveland, J.P.1    Manne, S.2    Bocek, D.3    Hansma, P.K.4
  • 11
    • 0001155528 scopus 로고    scopus 로고
    • Calibration of rectangular atomic force microscope cantilever
    • J. E. Sader, J. W. M. Chon, and P. Mulvaney, "Calibration of rectangular atomic force microscope cantilever," Rev. Scientific Instrum., vol. 70, no. 10, pp. 403-405, 1999.
    • (1999) Rev. Scientific Instrum. , vol.70 , Issue.10 , pp. 403-405
    • Sader, J.E.1    Chon, J.W.M.2    Mulvaney, P.3
  • 13
    • 77955134037 scopus 로고    scopus 로고
    • Man-machine interface for micro/nano manipulation with afm probe
    • Maui, HI, Oct
    • B. Aruk, H. Hashimoto, and M. Sitti, "Man-machine interface for micro/nano manipulation with afm probe," in Proc. IEEE Int. Conf. Nanotechnology, Maui, HI, Oct. 2001, pp. 151-156.
    • (2001) Proc. IEEE Int. Conf. Nanotechnology , pp. 151-156
    • Aruk, B.1    Hashimoto, H.2    Sitti, M.3
  • 15
    • 0029178779 scopus 로고
    • Micro manipulation based on microphysics: Stratege based on attractive force reduction and stress measurement
    • Pittsburgh, PA, May
    • F. Arai, D. Ando, and T. Fukuda, "Micro manipulation based on microphysics: Stratege based on attractive force reduction and stress measurement," in Proc. IEEE Int. Conf. Robotics and Automation, Pittsburgh, PA, May 1995, pp. 236-241.
    • (1995) Proc. IEEE Int. Conf. Robotics and Automation , pp. 236-241
    • Arai, F.1    Ando, D.2    Fukuda, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.