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Volumn 76, Issue 8, 1996, Pages 1276-1279
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Quantitative scanning tunneling microscopy at atomic resolution: Influence of forces and tip configuration
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000501079
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.76.1276 Document Type: Article |
Times cited : (66)
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References (22)
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