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Volumn 76, Issue 8, 1996, Pages 1276-1279

Quantitative scanning tunneling microscopy at atomic resolution: Influence of forces and tip configuration

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000501079     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.76.1276     Document Type: Article
Times cited : (66)

References (22)
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    • 0038186820 scopus 로고
    • R. J. Behm, N. Garcia, and H. Rohrer, Kluwer Academic Publishers, Dordrecht
    • R. J. Behm, in Scanning Tunnelling Microscopy and Related Methods, R. J. Behm, N. Garcia, and H. Rohrer (Kluwer Academic Publishers, Dordrecht, 1990), pp. 173–209.
    • (1990) Scanning Tunnelling Microscopy and Related Methods , pp. 173-209
    • Behm, R.J.1
  • 4
    • 0028485604 scopus 로고
    • SUSCAS
    • P. Sautet et al: Surf. Sci. 315, 127 (1994). SUSCAS.
    • (1994) Surf. Sci , vol.315 , pp. 127
    • Sautet, P.1
  • 13
    • 5544290886 scopus 로고
    • SUSCAS
    • L. Eirdal et al: Surf. Sci. 312, 39 (1994). SUSCAS.
    • (1994) Surf. Sci , vol.312 , pp. 39
    • Eirdal, L.1
  • 14
  • 15
    • 0001562185 scopus 로고
    • PRBMDO
    • G. Doyen et al: Phys. Rev. B 48, 1738 (1993). PRBMDO.
    • (1993) Phys. Rev. B , vol.48 , pp. 1738
    • Doyen, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.