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Volumn 96, Issue 25, 2010, Pages

Electrical breakdown of ZnO nanowires in metal-semiconductor-metal structure

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED ELECTRIC FIELD; BREAK-POINTS; ELECTRIC FIELD INTENSITIES; ELECTRICAL BREAKDOWN; ELECTRICAL TRANSPORT; FAILURE PROCESS; HIGH ELECTRIC FIELDS; JOINT EFFECT; METAL-SEMICONDUCTOR-METAL STRUCTURES; POLYCRYSTALLINE; RECRYSTALLIZATIONS; SCANNING ELECTRON MICROSCOPE; SINGLE-CRYSTALLINE; ZNO NANOWIRES;

EID: 77954071709     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3457169     Document Type: Article
Times cited : (38)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.