In situ TEM-STM recorded kinetics of boron nitride nanotube failure under current flow

Nano Letters

Volumn 9, Issue 6, 2009, Pages 2251-2254

  Xu, Zhi ^a   Golberg, Dmitri ^a   Bando, Yoshio ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BORON NITRIDE NANOTUBES; BREAKDOWN CURVES; CURRENT FLOWS; DECOMPOSITION TEMPERATURE; DIRECT OBSERVATION; ELECTRICAL FIELD; ELECTRICAL TRANSPORT; FAILURE PROCESS; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPES; IN-SITU TEM; IONIC NATURE; MULTI-WALLED; SCANNING TUNNELING MICROSCOPES; THERMAL DECOMPOSITION TEMPERATURE; THERMAL DECOMPOSITIONS;

BORON; MICROSCOPES; NANOTUBES; NITRIDES; PHOTORESISTS; PYROLYSIS; TRANSMISSION ELECTRON MICROSCOPY;

BORON NITRIDE;

EID: 66749101285     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl900379c     Document Type: Article

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