Electrical and mechanical coupling nanodamage in single ZnO nanobelts

Applied Physics Letters

Volumn 96, Issue 12, 2010, Pages

  Yang, Ya ^a   Qi, Junjie ^a   Gu, Yousong ^a   Guo, Wen ^a   Zhang, Yue ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE ATOMIC FORCE MICROSCOPES; DAMAGE THRESHOLD; ELECTRIC STRUCTURE; LOADING FORCE; MECHANICAL COUPLING; STRAIN-INDUCED CHANGE; ZNO;

NANOBELTS; THRESHOLD VOLTAGE;

ZINC OXIDE;

EID: 77950321664     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3368699     Document Type: Article

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