Electric-induced nanodamage in single ZnO nanowires

Journal of Applied Physics

Volumn 105, Issue 8, 2009, Pages

  Yang, Ya ^a   Zhang, Yue ^a   Qi, Junjie ^a   Liao, Qingliang ^a   Tang, Lidan ^a   Wang, Yishu ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED VOLTAGES; CONDUCTIVE ATOMIC FORCE MICROSCOPES; DAMAGING PROCESS; EVAPORATION TIME; QUANTUM CONFINEMENT EFFECTS; SINGLE NANOWIRES; ZNO NANOWIRES;

NANOWIRES; SEMICONDUCTING ZINC COMPOUNDS; ZINC OXIDE;

ELECTRIC WIRE;

EID: 65449143197     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3116731     Document Type: Article

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