Ultra-fast interconnect driven cell cloning for minimizing critical path delay

Proceedings of the International Symposium on Physical Design

Volumn , Issue , 2010, Pages 75-82

  Li, Zhuo ^a   Papa, David A ^a,b   Alpert, Charles J ^a   Hu, Shiyan ^c   Shi, Weiping ^d   Sze, Cliff ^a   Zhou, Ying ^a,d  

^a IBM AUSTIN RESEARCH LABORATORY   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

^c Michigan Technological University   (United States)

^d Department of Electrical and Computer Engineering   (United States)

Author keywords

Gate duplication; Physical synthesis; Timing driven placement

Indexed keywords

45NM TECHNOLOGY; A-TRANSFORM; CELL CLONING; CRITICAL PATH DELAYS; CRITICAL PATHS; GATE SIZING; INTERCONNECT DELAY; PHYSICAL LOCATIONS; PHYSICAL SYNTHESIS; POLYNOMIAL-TIME; TEST CASE; TIME-OPTIMAL ALGORITHM; TIMING DRIVEN PLACEMENT; TIMING MODELS; TIMING-DRIVEN; ULTRA-FAST; WIRE LENGTH;

ALGORITHMS; CLONE CELLS; CLONING; MOBILE TELECOMMUNICATION SYSTEMS; OPTIMIZATION; SYNTHESIS (CHEMICAL);

TIME MEASUREMENT;

EID: 77952286035     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1735023.1735047     Document Type: Conference Paper

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