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Volumn 107, Issue 7, 2010, Pages

Temperature analysis of AlGaN/GaN based devices using photoluminescence spectroscopy: Challenges and comparison to Raman thermography

(5) Batten, T a Manoi, A a Uren, M J b Martin, T b Kuball, M a

a UNIVERSITY OF BRISTOL (United Kingdom)

b QINETIQ (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALGAN/GAN; CORRESPONDING SOLUTIONS; TEMPERATURE ANALYSIS; THERMAL BOUNDARY RESISTANCE; THERMAL MODELING; VERTICAL TEMPERATURE DISTRIBUTION;

GALLIUM NITRIDE; GLASS INDUSTRY; PHOTOLUMINESCENCE; PHOTOLUMINESCENCE SPECTROSCOPY; REMOTE SENSING; TEMPERATURE DISTRIBUTION; THERMOANALYSIS; THERMOGRAPHY (IMAGING);

THERMOGRAPHY (TEMPERATURE MEASUREMENT);

EID: 77951615035 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3359651 Document Type: Article

Times cited : (31)

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