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Volumn , Issue , 2009, Pages

Lead-free soldering of telecommunication network infrastructure products

(2)  Eriksson, Bo a   Trankell, Richard a  

a NONE

Author keywords

Design for environment; Lead free; Soldering; Telecommunication

Indexed keywords

COMPONENT SELECTION; DESIGN FOR ENVIRONMENT; ERICSSON; LEAD FREE SOLDERS; LEAD-FREE; LEAD-FREE CONVERSION; LEAD-FREE SOLDERING; POTENTIAL PROBLEMS; PRODUCT DEVELOPMENT PROCESS; PRODUCTION PROCESS; TELECOM NETWORKS;

EID: 77950974672     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSST.2009.5156736     Document Type: Conference Paper
Times cited : (3)

References (21)
  • 4
    • 60049098423 scopus 로고    scopus 로고
    • Evaluation of Pure Tin Plated Copper Alloy Substrates for Tin Whiskers
    • Evaluation of Pure Tin Plated Copper Alloy Substrates for Tin Whiskers Mathew, S., M. Osterman, M. Pecht, and F. Dunlevey, Circuit World, Vol.35, No.1, pp. 3-8, 2009
    • (2009) Circuit World , vol.35 , Issue.1 , pp. 3-8
    • Mathew, S.1    Osterman, M.2    Pecht, M.3    Dunlevey, F.4
  • 6
    • 49349087347 scopus 로고    scopus 로고
    • Effect of Primary Creep Behavior on Fatigue Damage Accumulation Rates in Accelerated Thermal Cycling of Sn3.0Ag0.5Cu Pb-Free Interconnects
    • Effect of Primary Creep Behavior on Fatigue Damage Accumulation Rates in Accelerated Thermal Cycling of Sn3.0Ag0.5Cu Pb-Free Interconnects, G. Cuddalorepatta, and A. Dasgupta, Proceedings, EuroSiME Conference, April 2008, Freiburg, Germany.
    • Proceedings, EuroSiME Conference, April 2008, Freiburg, Germany
    • Cuddalorepatta, G.1    Dasgupta, A.2
  • 7
    • 40549107504 scopus 로고    scopus 로고
    • Microstructure and Intermetallics Formation in SnAgCu BGA Components attached with SnPb Solder under Isothermal Aging
    • Microstructure and Intermetallics Formation in SnAgCu BGA Components attached with SnPb Solder under Isothermal Aging , A. Choubey, M. Osterman, and M. Pecht. IEEE Transactions on Device and Materials Reliability, Vol 8, Issue 1, pp 160-167, 2008.
    • (2008) IEEE Transactions on Device and Materials Reliability , vol.8 , Issue.1 , pp. 160-167
    • Choubey, A.1    Osterman, M.2    Pecht, M.3
  • 8
    • 40549099421 scopus 로고    scopus 로고
    • Flex Cracking of Multilayer Ceramic Capacitors Assembled with Lead- Free and Tin-Lead Solders
    • March
    • Flex Cracking of Multilayer Ceramic Capacitors Assembled with Lead- Free and Tin-Lead Solders , M. Azarian, M. Keimasi, and M. Pecht, IEEE Transactions on Device and Materials Reliability, Vol.8, Issue 1, pp 182-192, March 2008
    • (2008) IEEE Transactions on Device and Materials Reliability , vol.8 , Issue.1 , pp. 182-192
    • Azarian, M.1    Keimasi, M.2    Pecht, M.3
  • 9
    • 34848820604 scopus 로고    scopus 로고
    • Strain Range Fatigue Life Assessment of Lead-free Solder Interconnects Subject to Temperature Cycle Loading
    • Strain Range Fatigue Life Assessment of Lead-free Solder Interconnects Subject to Temperature Cycle Loading, M. Osterman and M. Pecht, Soldering & surface Mount Technology, Vol.19, No.2, pp. 12-17, 2007.
    • (2007) Soldering & Surface Mount Technology , vol.19 , Issue.2 , pp. 12-17
    • Osterman, M.1    Pecht, M.2
  • 13
    • 33847256499 scopus 로고    scopus 로고
    • Assessment of Risk Resulting from Unattached Tin Whisker Bridging
    • Assessment of Risk Resulting from Unattached Tin Whisker Bridging, T. Fang, S. Mathew, M. Osterman, and M. Pecht, Circuit World, Vol.33, No.1, pp. 5-8, 2007.
    • (2007) Circuit World , vol.33 , Issue.1 , pp. 5-8
    • Fang, T.1    Mathew, S.2    Osterman, M.3    Pecht, M.4
  • 16
    • 51349119304 scopus 로고    scopus 로고
    • The Effect of Sn Grain Number and Orientation on the Shear Fatigue Life of SnAgCu Solder Joints
    • B. Arfaei, Y. Xing, J. Woods, J. Wolcott, P. Tumne, P. Borgesen, and E. Cotts: "The Effect of Sn Grain Number and Orientation on the Shear Fatigue Life of SnAgCu Solder Joints", Proc. ECTC 2008, 459-465
    • Proc. ECTC 2008 , pp. 459-465
    • Arfaei, B.1    Xing, Y.2    Woods, J.3    Wolcott, J.4    Tumne, P.5    Borgesen, P.6    Cotts, E.7
  • 17
    • 77955216258 scopus 로고    scopus 로고
    • Cumulative and Synergistic Effects of Combined Mechanical Loading on Lead Free BGAs
    • B. Roggeman and P. Borgesen: "Cumulative and Synergistic Effects of Combined Mechanical Loading on Lead Free BGAs", Proc. SMTAI 2007
    • Proc. SMTAI 2007
    • Roggeman, B.1    Borgesen, P.2
  • 18
    • 70349672085 scopus 로고    scopus 로고
    • Correlation of Microstructure and Heterogeneous Failure in Pb Free Solder Joints
    • Pb-Free and RoHS-Compliant Materials and Processes for Microelectronics, C. A. Handwerker, K. Suganuma, H. L. Reynolds, J. Bath, eds.
    • T. Bieler, P. Borgesen, Y. Xing, L. Lehman, and E. Cotts: "Correlation of Microstructure and Heterogeneous Failure in Pb Free Solder Joints", Pb-Free and RoHS-Compliant Materials and Processes for Microelectronics, C. A. Handwerker, K. Suganuma, H. L. Reynolds, J. Bath, eds., MRS Spring Meeting, April 2007
    • MRS Spring Meeting, April 2007
    • Bieler, T.1    Borgesen, P.2    Xing, Y.3    Lehman, L.4    Cotts, E.5
  • 19
    • 77950969589 scopus 로고    scopus 로고
    • Effects of Stress and Strain on Void Growth in Cu3Sn
    • Pb-Free and RoHS-Compliant Materials and Processes for Microelectronics, C. A. Handwerker, K. Suganuma, H. L. Reynolds, J. Bath, eds.
    • M. Gao, L. Yin, P. Kondos, P. Borgesen and E. Cotts: "Effects of Stress and Strain on Void Growth in Cu3Sn", Pb-Free and RoHS-Compliant Materials and Processes for Microelectronics, C. A. Handwerker, K. Suganuma, H. L. Reynolds, J. Bath, eds., MRS Spring Meeting, April 2007
    • MRS Spring Meeting, April 2007
    • Gao, M.1    Yin, L.2    Kondos, P.3    Borgesen, P.4    Cotts, E.5
  • 20
    • 34248203639 scopus 로고    scopus 로고
    • Pb-Free Solder: New Materials Considerations for Microelectronics Processsing
    • April
    • P. Borgesen, T. Bieler, L. P. Lehman, and E. J. Cotts: "Pb-Free Solder: New Materials Considerations for Microelectronics Processsing", MRS Bulletin, Vol.32, April 2007, 360-365
    • (2007) MRS Bulletin , vol.32 , pp. 360-365
    • Borgesen, P.1    Bieler, T.2    Lehman, L.P.3    Cotts, E.J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.