Assessment of risk resulting from unattached tin whisker bridging

Circuit World

Volumn 33, Issue 1, 2007, Pages 5-8

  Fang, Tong ^a   Mathew, Sony ^a   Osterman, Michael ^a   Pecht, Michael ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Electric breakdown; Electric current; Electronic equipment and components; Risk assessment

Indexed keywords

CONTACT RESISTANCE; CRYSTAL WHISKERS; ELECTRIC BREAKDOWN; ELECTRIC CONDUCTORS; ELECTRIC CURRENTS; NETWORK COMPONENTS;

BRIDGING FAILURE RISK; UNATTACHED TIN WHISKER BRIDGING;

RISK ASSESSMENT;

EID: 33847256499     PISSN: 03056120     EISSN: None     Source Type: Journal    
DOI: 10.1108/03056120710723652     Document Type: Article

References (10)

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