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Volumn 91, Issue , 2009, Pages 123-138

An accurate complex permittivity method for thin dielectric materials

Author keywords

[No Author keywords available]

Indexed keywords

ETHYLENE; FREQUENCY BANDS; PARAMETER ESTIMATION; PERMITTIVITY; SCATTERING PARAMETERS; UNCERTAINTY ANALYSIS;

EID: 65449179203     PISSN: 10704698     EISSN: 15598985     Source Type: Journal    
DOI: 10.2528/PIER09011702     Document Type: Article
Times cited : (44)

References (29)
  • 2
    • 43449099278 scopus 로고    scopus 로고
    • Factors affecting the performance of the radar absorbant textile materials of different types and structures
    • Hebeish, A. A., M. A. Elgamel, R. A. Abdelhady, et al., "Factors affecting the performance of the radar absorbant textile materials of different types and structures," Progress In Electromagnetics Research B, Vol. 3, 219-226, 2008.
    • (2008) Progress In Electromagnetics Research B , vol.3 , pp. 219-226
    • Hebeish, A.A.1    Elgamel, M.A.2    Abdelhady, R.A.3
  • 3
    • 34547416685 scopus 로고    scopus 로고
    • Dielectric constant measurement for thin material at microwave frequencies
    • PIER
    • Chung, B.-K., "Dielectric constant measurement for thin material at microwave frequencies," Progress In Electromagnetics Research, PIER 75, 239-252, 2007.
    • (2007) Progress In Electromagnetics Research , vol.75 , pp. 239-252
    • Chung, B.-K.1
  • 4
    • 27744593554 scopus 로고    scopus 로고
    • Broadband complex permittivity measurement techniques of materials with thin configuration at microwave frequencies
    • 084107-1-084107-08
    • Murata, K., A. Hanawa, and R. Nozaki, "Broadband complex permittivity measurement techniques of materials with thin configuration at microwave frequencies," J. Applied Phys., Vol. 98, 084107-1-084107-08, 2005.
    • (2005) J. Applied Phys. , vol.98
    • Murata, K.1    Hanawa, A.2    Nozaki, R.3
  • 5
    • 0016315878 scopus 로고
    • Simple non-destructive method for the measurement of complex permittivity
    • Decreton, M. C. and F. E. Gardiol, "Simple non-destructive method for the measurement of complex permittivity," IEEE Trans. Instrum. Meas., Vol. 23, 434-438, 1974.
    • (1974) IEEE Trans. Instrum. Meas. , vol.23 , pp. 434-438
    • Decreton, M.C.1    Gardiol, F.E.2
  • 6
    • 85007020795 scopus 로고    scopus 로고
    • An improved method for microwave nondestructive dielectric measurement of layered media
    • Zhang, H., S. Y. Tan, and H. S. Tan, "An improved method for microwave nondestructive dielectric measurement of layered media," Progress in Electromagnetics Research B, Vol. 10, 145-161,2008.
    • (2008) Progress in Electromagnetics Research B , vol.10 , pp. 145-161
    • Zhang, H.1    Tan, S.Y.2    Tan, H.S.3
  • 7
    • 0036538708 scopus 로고    scopus 로고
    • Thickness-independent measurement of the permittivity of thin samples in the X band
    • Olmi, R., M. Tedesco, C. Riminesi, et al., "Thickness-independent measurement of the permittivity of thin samples in the X band," Meas. Sci. Technol., Vol. 13, 503-509, 2002.
    • (2002) Meas. Sci. Technol. , vol.13 , pp. 503-509
    • Olmi, R.1    Tedesco, M.2    Riminesi, C.3
  • 8
    • 0028523064 scopus 로고
    • Analysis of an open-ended coaxial probe with lift-off for nondestructive testing
    • Baker-Jarvis, J., M. D. Janezic, P. D. Domich, et al., "Analysis of an open-ended coaxial probe with lift-off for nondestructive testing," IEEE Trans. Instrum. Meas., Vol. 43, 711-718, 1994.
    • (1994) IEEE Trans. Instrum. Meas. , vol.43 , pp. 711-718
    • Baker-Jarvis, J.1    Janezic, M.D.2    Domich, P.D.3
  • 9
    • 0025414694 scopus 로고
    • Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies
    • Ghodgaonkar, D. K., V. V. Varadan, and V. K. Varadan, "Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies," IEEE Trans. Instrum. Meas., Vol. 39, 387-394, 1990.
    • (1990) IEEE Trans. Instrum. Meas. , vol.39 , pp. 387-394
    • Ghodgaonkar, D.K.1    Varadan, V.V.2    Varadan, V.K.3
  • 10
    • 33144490675 scopus 로고    scopus 로고
    • Error correction for diffraction and multiple scattering in free-space microwave measurement of materials
    • Hock, K. M., "Error correction for diffraction and multiple scattering in free-space microwave measurement of materials," IEEE Trans. Microw Theory Tech., Vol. 54, 648-659, 2006.
    • (2006) IEEE Trans. Microw Theory Tech. , vol.54 , pp. 648-659
    • Hock, K.M.1
  • 11
    • 34648822410 scopus 로고    scopus 로고
    • A microcontroller-based microwave measurement system for permittivity determination of fresh cement-based materials
    • Proc. IEEE Instrumentation and Measurement Technology Conf. (IMTC'07)
    • Hasar, U. C., "A microcontroller-based microwave measurement system for permittivity determination of fresh cement-based materials," Proc. IEEE Instrumentation and Measurement Technology Conf. (IMTC'07), 2007.
    • (2007)
    • Hasar, U.C.1
  • 12
    • 34249817154 scopus 로고    scopus 로고
    • Building a resonant cavity for the measurement of microwave dielectric permittivity of high loss materials
    • Rubinger, C. P. L. and L. C. Costa, "Building a resonant cavity for the measurement of microwave dielectric permittivity of high loss materials," Microwave Opt. Tech. Lett., Vol. 49, 1687-1690, 2007.
    • (2007) Microwave Opt. Tech. Lett. , vol.49 , pp. 1687-1690
    • Rubinger, C.P.L.1    Costa, L.C.2
  • 13
    • 0025474631 scopus 로고
    • Improved technique for determining complex permittivity with the transmission/reflection method
    • Baker-Jarvis, J., E. J. Vanzura, and W. A. Kissick, "Improved technique for determining complex permittivity with the transmission/reflection method," IEEE Trans. Microw. Theory Tech., Vol. 38, 1096-1103, 1990.
    • (1990) IEEE Trans. Microw. Theory Tech. , vol.38 , pp. 1096-1103
    • Baker-Jarvis, J.1    Vanzura, E.J.2    Kissick, W.A.3
  • 14
    • 0024124177 scopus 로고
    • Technique for measuring the dielectric constant of thin materials
    • Sarabandi, K. and F. T. Ulaby, "Technique for measuring the dielectric constant of thin materials," IEEE Trans. Instrum. Meas., Vol. 37, 631-636, 1988.
    • (1988) IEEE Trans. Instrum. Meas. , vol.37 , pp. 631-636
    • Sarabandi, K.1    Ulaby, F.T.2
  • 15
    • 0026931327 scopus 로고
    • Dielectric materials measurement of thin samples at millimeter wavelengths
    • Kenneth, E. D. and L. J. Buckley, "Dielectric materials measurement of thin samples at millimeter wavelengths," IEEE Trans. Instrum. Meas., Vol. 41, 723-725, 1992.
    • (1992) IEEE Trans. Instrum. Meas. , vol.41 , pp. 723-725
    • Kenneth, E.D.1    Buckley, L.J.2
  • 16
    • 33646425600 scopus 로고    scopus 로고
    • A convenient method for complex permittivity measurement of thin materials at microwave frequencies
    • Chung, B.-K., "A convenient method for complex permittivity measurement of thin materials at microwave frequencies," J. Phys. D.: Appl. Phys., Vol. 39, 1926-1931, 2006.
    • (2006) J. Phys. D. Appl. Phys. , vol.39 , pp. 1926-1931
    • Chung, B.-K.1
  • 17
    • 40549100521 scopus 로고    scopus 로고
    • Permittivitymeasurement with a non-standard waveguide by using TRL calibration and fractional linear data fitting
    • Challa, R. K., D. Kajfez, J. R. Gladden, et al., "Permittivitymeasurement with a non-standard waveguide by using TRL calibration and fractional linear data fitting," Progress InElectromagnetics Research B, Vol. 2, 1-13, 2008.
    • (2008) Progress InElectromagnetics Research B , vol.2 , pp. 1-13
    • Challa, R.K.1    Kajfez, D.2    Gladden, J.R.3
  • 18
    • 0022150784 scopus 로고    scopus 로고
    • Broad-band permittivity measurements using the semi-automatic network analyzer
    • Ness, J., "Broad-band permittivity measurements using the semi-automatic network analyzer," IEEE Trans. Microw. Theory Tech., Vol. 33, 1222-1226, 1985.
    • IEEE Trans. Microw. Theory Tech. , vol.33 , pp. 1222-1226
    • Ness, J.1
  • 19
    • 42549125444 scopus 로고    scopus 로고
    • Two novel amplitude-only methods for complex permittivity determination of medium-and low-loss materials
    • Hasar, U. C., "Two novel amplitude-only methods for complex permittivity determination of medium-and low-loss materials," Meas. Sci. Techol., Vol. 19, 055706-055715, 2008.
    • (2008) Meas. Sci. Techol. , vol.19 , pp. 055706-055715
    • Hasar, U.C.1
  • 20
    • 60349108442 scopus 로고    scopus 로고
    • A broadband and stable method for unique complex permittivity determination of low-loss materials
    • Hasar, U. C. and C. R. Westgate,"A broadband and stable method for unique complex permittivity determination of low-loss materials," IEEE Trans. Microw. Theory Tech., Vol. 57, 471-477, 2009.
    • (2009) IEEE Trans. Microw. Theory Tech. , vol.57 , pp. 471-477
    • Hasar, U.C.1    Westgate, C.R.2
  • 21
    • 51649087593 scopus 로고    scopus 로고
    • A fast and accurate amplitude-only transmission reflection method for complex permittivity determination of lossy materials
    • Hasar, U. C., "A fast and accurate amplitude-only transmission reflection method for complex permittivity determination of lossy materials," IEEE Trans. Microw. Theory Tech., Vol. 56, 2129-2135,2008.
    • (2008) IEEE Trans. Microw. Theory Tech. , vol.56 , pp. 2129-2135
    • Hasar, U.C.1
  • 22
    • 63749124419 scopus 로고    scopus 로고
    • Simple calibration plane-invariant method for complex permittivity determination of dispersive and non-dispersive low-loss materials
    • Hasar, U. C.,"Simple calibration plane-invariant method for complex permittivity determination of dispersive and non-dispersive low-loss materials," IET Microw. Antennas Propag., 2009.
    • IET Microw. Antennas Propag. , pp. 2009
    • Hasar, U.C.1
  • 23
    • 60349088835 scopus 로고    scopus 로고
    • Elimination of the multiple-solutions ambiguity in permittivity extraction from transmission-only measurements of lossy materials
    • Hasar, U. C., "Elimination of the multiple-solutions ambiguity in permittivity extraction from transmission-only measurements of lossy materials," Microw. Opt. Technol. Lett., Vol. 51, 337-341, 2009.
    • (2009) Microw. Opt. Technol. Lett. , vol.51 , pp. 337-341
    • Hasar, U.C.1
  • 27
    • 0141841503 scopus 로고
    • Transmission/reflection and short-circuit line permittivity measurements
    • Boulder. CO. Tech., July
    • Baker-Jarvis, J., "Transmission/reflection and short-circuit line permittivity measurements" Natl. Inst. Stand. Technol.,1341, Boulder. CO. Tech., July 1990.
    • (1990) Natl. Inst. Stand. Technol. , pp. 1341
    • Baker-Jarvis, J.1
  • 28
    • 0018720739 scopus 로고
    • Thru-reflect-line': An improved technique for calibrating the dual six-port automatic network analyzer
    • Engen, G. F. and C. A. Hoer, "Thru-reflect-line': An improved technique for calibrating the dual six-port automatic network analyzer," IEEE Trans. Microw. Theory Tech., Vol. 27, 987-993, 1979.
    • (1979) IEEE Trans. Microw. Theory Tech. , vol.27 , pp. 987-993
    • Engen, G.F.1    Hoer, C.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.