Modified transmission-reflection method for measuring constitutive parameters of thin flexible high-loss materials

IEEE Transactions on Microwave Theory and Techniques

Volumn 51, Issue 5, 2003, Pages 1560-1566

  Williams, Trevor C ^a,b   Stuchly, Maria A ^a   Saville, Paul ^c  

^a UNIVERSITY OF VICTORIA   (Canada)

^b UNIVERSITY OF CALGARY   (Canada)

^c DEFENCE RESEARCH AND DEVELOPMENT CANADA   (Canada)

Author keywords

High loss dielectrics; Measurements; Permittivity; Uncertainty analysis

Indexed keywords

FINITE DIFFERENCE METHOD; OPTIMIZATION; PERMITTIVITY; TIME DOMAIN ANALYSIS; WAVEGUIDES;

UNCERTAINTY ANALYSIS;

DIELECTRIC MATERIALS;

EID: 0038056176     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2003.810139     Document Type: Article

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