Thickness-Independent automated constitutive parameters extraction of thin solid and liquid materials from waveguide measurements

Progress in Electromagnetics Research

Volumn 92, Issue , 2009, Pages 17-32

  Hasar, U C ^a,b  

^a ATATÜRK UNIVERSITY   (Turkey)

^b State University of New York at Binghamton   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIQUIDS; SCATTERING PARAMETERS; WAVEGUIDES;

COMPLEX PERMITTIVITY; CONSTITUTIVE PARAMETERS; LIQUID MATERIALS; MEASUREMENT CELL; MEASUREMENT PLANES; MICROWAVE WAVEGUIDES; TRANSMISSION REFLECTION; WAVEGUIDE MEASUREMENTS;

PARAMETER ESTIMATION;

EID: 67649392708     PISSN: 10704698     EISSN: 15598985     Source Type: Journal    
DOI: 10.2528/PIER09031606     Document Type: Article

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