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Volumn 92, Issue , 2009, Pages 17-32

Thickness-Independent automated constitutive parameters extraction of thin solid and liquid materials from waveguide measurements

Author keywords

[No Author keywords available]

Indexed keywords

LIQUIDS; SCATTERING PARAMETERS; WAVEGUIDES;

EID: 67649392708     PISSN: 10704698     EISSN: 15598985     Source Type: Journal    
DOI: 10.2528/PIER09031606     Document Type: Article
Times cited : (22)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.