Accurate determination of the complex permittivity of materials with transmission reflection measurements in partially filled rectangular waveguides

IEEE Transactions on Microwave Theory and Techniques

Volumn 51, Issue 1 I, 2003, Pages 16-24

  Catalá Civera, José M ^a   Canós, Antoni J ^a   Peñaranda Foix, Felipe L ^a   De Los Reyes Davó, Elias ^a  

^a UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

Author keywords

Accuracy study; Dielectric properties; Microwave measurements; Rectangular waveguides

Indexed keywords

APPROXIMATION THEORY; BOUNDARY CONDITIONS; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES OF SOLIDS; ELECTRIC NETWORK ANALYZERS; ITERATIVE METHODS; OPTICAL VARIABLES MEASUREMENT; PERMITTIVITY MEASUREMENT; PERTURBATION TECHNIQUES; REFLECTION; SCATTERING PARAMETERS;

PERTURBATIONAL APPROXIMATION; TRANSMISSION REFLECTION; VECTOR NETWORK ANALYZER;

RECTANGULAR WAVEGUIDES;

EID: 0037251035     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2002.806940     Document Type: Article

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