A new microwave method for electrical characterization of low-loss materials

IEEE Microwave and Wireless Components Letters

Volumn 19, Issue 12, 2009, Pages 801-803

  Hasar, Ugur Cem ^a,b  

^a ATATÜRK UNIVERSITY   (Turkey)

^b State University of New York   (United States)

Author keywords

Calibration; Permittivity measurement; Scattering parameters measurement

Indexed keywords

COMPLEX PERMITTIVITY; ELECTRICAL CHARACTERIZATION; INHOMOGENEITIES; LOW LOSS; LOW LOSS MATERIAL; MEASUREMENT CELL; MEASUREMENT RESULTS; MICROWAVE METHODS; SAMPLE THICKNESS; SCATTERING PARAMETER MEASUREMENT; SCATTERING PARAMETERS MEASUREMENT; THEORETICAL FORMULATION;

CALIBRATION; MEASUREMENT ERRORS; MEASUREMENTS; MICROWAVES; PERMITTIVITY; PERMITTIVITY MEASUREMENT; SCATTERING; SCATTERING PARAMETERS; UNCERTAINTY ANALYSIS; WIRELESS TELECOMMUNICATION SYSTEMS;

DIELECTRIC MATERIALS;

EID: 72649084940     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2009.2033512     Document Type: Article

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