Characterisation of layered dielectric medium using reflection coefficient

Electronics Letters

Volumn 34, Issue 12, 1998, Pages 1207-1208

  Huang, Y ^a   Nakhkash, M ^a  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; MATHEMATICAL MODELS; PERMITTIVITY;

REFLECTION COEFFICIENT;

DIELECTRIC WAVEGUIDES;

EID: 0032098081     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19980862     Document Type: Article

References (3)

1. AFSAR, M.N., BIRCH, J.R., CLARKE, R.N., and CHANTRY, G.W.: 'The measurement of the properties of materials', Proc. IEEE, 1986, 74, pp. 183-199
2. TAM, W.K., and TRAN, V.N.: 'Propagation modelling for indoor wireless communication', Electron. Commun. Eng. J., 1995, 7, pp. 221-228
3. HARRINGTON, R.F.: 'Time harmonic electromagnetic fields' (McGraw-Hill, New York, 1961), Chap. 4