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Volumn , Issue , 2006, Pages 108-131

Electrical and Environmental Stability of Polymer Thin-Film Transistors

Author keywords

Advanced materials; Bias stress in polyfluorene TETs; Bias stress in polythiophene TFTs; Charge trapping in TFTs; Chemical effects on stability; Defects; Electrical stability of polymer thin film transistors (TFTs); Environmental stability of polymer thin film transistors (TFTs); Impurities; Organic electronics

Indexed keywords


EID: 75749112783     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/3527608753.ch5     Document Type: Chapter
Times cited : (6)

References (62)
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    • Skotheim, T.A.1    Elsenbaumer, R.L.2    Reynolds, J.R.3
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  • 62


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.