Reversible and irreversible trapping at room temperature in poly(thiophene) thin-film transistors

Applied Physics Letters

Volumn 86, Issue 26, 2005, Pages 1-3

  Salleo, A ^a   Endicott, F ^a   Street, R A ^a  

^a PALO ALTO RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRAPPING; DEVICE LIFETIME; GATE BIAS; TRAPPING RATE;

CARRIER MOBILITY; CRYSTALLINE MATERIALS; ELECTRIC CHARGE; ELECTRIC SWITCHES; ORGANIC POLYMERS; STRESSES; SUBSTRATES; THRESHOLD VOLTAGE;

THIN FILM TRANSISTORS;

EID: 22144488797     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1968437     Document Type: Article

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