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Volumn 85, Issue 8, 2004, Pages 1377-1379
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Influence of intensive light exposure on polymer field-effect transistors
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
DEGRADATION;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
LIGHTING;
PELTIER EFFECT;
PERMITTIVITY;
PHOTOLITHOGRAPHY;
POLYETHYLENE TEREPHTHALATES;
POLYMER BLENDS;
POLYMETHYL METHACRYLATES;
SEMICONDUCTING POLYMERS;
THRESHOLD VOLTAGE;
ULTRAVIOLET RADIATION;
ULTRAVIOLET SPECTROPHOTOMETERS;
ULTRAVIOLET SPECTROSCOPY;
GATE-SOURCE VOLTAGES;
INFRARED (IR) SPECTROMETRY;
POLYMER FIELD-EFFECT TRANSISTORS (PFET);
RELATIVE PERMITIVITY;
FIELD EFFECT TRANSISTORS;
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EID: 4544324505
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1784547 Document Type: Article |
Times cited : (44)
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References (9)
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