Spectroscopic method of strain analysis in semiconductor quantum-well devices

Journal of Applied Physics

Volumn 96, Issue 8, 2004, Pages 4056-4065

  Biermann, Mark L ^a   Duran, Steven ^a   Peterson, Kelsey ^a   Gerhardt, Axel ^b   Tomm, Jens W ^b   Bercha, Artem ^c   Trzeciakowski, Witold ^c  

^a UNITED STATES NAVAL ACADEMY   (United States)

^b MAX BORN INSTITUT   (Germany)

^c INSTITUTE OF HIGH PRESSURE PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

PHOTOCURRENT SPECTROSCOPY (PCS); SEMICONDUCTOR QUANTUM-WELL DEVICES; STRAIN ANALYSIS; TRANSITION ENERGY;

BAND STRUCTURE; BINDING ENERGY; ELECTRONIC STRUCTURE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MATHEMATICAL MODELS; QUANTUM THEORY; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR LASERS; SEMICONDUCTOR QUANTUM WELLS; SPECTROSCOPIC ANALYSIS; STRAIN;

SEMICONDUCTOR DEVICES;

EID: 7544226079     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1791754     Document Type: Article

References (50)

1. E. P. O'Reilly, Semicond. Sci. Technol. 4, 121 (1989).
2. C. Mailhiot and D. L. Smith, Phys. Rev. B 33, 8360 (1986).
3. C. Mailhiot and D. L. Smith, Phys. Rev. B 35, 1242 (1987).
4. P. Lefebvre, B. Gil, H. Mathieu, and R. Planel, Phys. Rev. B 40, 7802 (1989).
5. G. Rau, P. C. Klipstein, V. Nikos Nicopoutos, and N. F. Johnson, Phys. Rev. B 54, 5700 (1996).
6. G. Ran, P. C. Klipstein, and N. F. Johnson, Phys. Rev. B 58, 7210 (1998).
7. G. Rau, A. R. Glanfield, P. C. Klipstein, N. F. Johnson, and G. W. Smith, Phys. Rev. B 60, 1900 (1999).
8. M. F. Huang, E. Garmire, A. Partovi, and M. Hong, Appl. Phys. Lett. 66, 736 (1995).
9. M. F. Huang, E. Garmire, and Y.-K. Kuo, Jpn. J. Appl. Phys., Part 1 39, 1776 (2000).
10. C. Mailhiot and D. L. Smith, Phys. Rev. B 36, 2942 (1987).
11. H. Qiang, Fred H. Pollak, C. Mailhiot, G. D. Pettit, and J. M. Woodall, Surf. Sci. 267, 103 (1992).
12. H. Qiang, Fred H. Pollak, R. N. Sacks, Solid State Commun. 84, 51 (1992).
13. H. Qiang, Fred H. Pollak, C. Mailhiot, G. D. Pettit, and J. M. Woodall, Phys. Rev. B 44, 9126 (1991).
14. D. A. Broido and S.-R. Eric Yang, Phys. Rev. B 42, 11051 (1990).
15. Johnson Lee and M. O. Vassell, Phys. Rev. B 37, 8855 (1988).
16. Johnson Lee and M. O. Vassell, Phys. Rev. B 37, 8861 (1988).
17. Johnson Lee, C. Jagannath, M. O. Vassell, and Emil S. Koteles, Phys. Rev. B 37, 4164 (1988).
18. R. Sooryakumar, A. Pinczuk, A. C. Gossard, D. S. Chemla, and L. J. Sham. Phys. Rev. Lett. 58, 1150 (1987).
19. Y.-C. Chang, H. Y. Chu, and S. G. Chung, Phys. Rev. B 33, 7364 (1986).
20. A. Simon, D. Bertho, D. Boiron, and C. Jouanin, Phys. Rev. B 40, 8459 (1989).
21. G. D. Sanders and Y. C. Chang, Phys. Rev. B 32, 4282 (1985).
22. S. Chichibu, A. Shikanai, T. Azuhata, T. Sota, A. Kuramata, K. Horino, and S. Nakamura, Appl. Phys. Lett. 68, 3766 (1996).
23. M. P. Houng, Y. H. Wang, K. K. Chong, S. S. Lin, and J. S. Hsu, Mater. Chem. Phys. 42, 195 (1995).
24. J. W. Tomm, R. Müller, A. Bärwolff, T. Elsaesser, D. Lorenzen, F. X. Daiminger, A. Gerhardt, and J. Donecker, Appl. Phys. Lett. 73, 3908 (1998).
25. J. W. Tomm et al., J. Appl. Phys. 86, 1196 (1999).
26. H. Shen, M. Wraback, J. Pamulapati, P. G. Newman, M. Dutta, Y. Lu, and H. C. Kuo, Phys. Rev. B 47, 13933 (1993).
27. J. W. Tomm, A. Gerhardt, R. Müller, M. L. Biermann, J. P. Holland, D. Lorenzen, and E. Kaulfersch, Appl. Phys. Lett. 82, 4193 (2003).
28. W. C. Tang, H. J. Rosen, S. Guha, and A. Madhukar, Appl. Phys. Lett. 58, 1644 (1991).
29. I. De Wolff, G. Pozzat, K. Pinardi, D. J. Howard, M. Ignat, S. C. Jain, and H. E. Maes, Microelectron. Reliab. 36, 1751 (1996).
30. J. P. Landesman, A. Fiore, J. Nagele, V. Berger, E. Rosencher, and P. Puech, Appl. Phys. Lett. 71, 2520 (1997).
31. I. De Wolf and H. E. Maes, Microsystem Technologies 5, 13 (1998).
32. A. Atkinson and S. C. Jain, J. Raman Spectrosc. 30, 885 (1999).
33. P. Martin, J. P. Landesman, J. P. Hirtz, and A. Fily, Appl. Phys. Lett. 75, 2521 (1999).
34. P. Martin, J. P. Landesman, E. Martin, A. Fily, and J. P. Hirtz, Proc. SPIE 3945, 308 (2000).
35. J.-P. Landesmann, Mater. Sci. Eng., A B91-92, 55 (2002).
36. J. W. Tomm, A. Gerhardt, T. Elsaesser, D. Lorenzen, and P. Hennig, Appl. Phys. Lett. 81, 3269 (2002).
37. R. Xia, E. C. Larkins, I. Harrison, S. R. A. Dods, A. V. Andrianov, J. Morgan, and J. P. Landesman, IEEE Photonics Technol. Lett. 14, 893 (2002).
38. J. W. Tomm, A. Gerhardt, R. Müller, V. Malyarchuk, Y. Sainte-Marie, P. Galtier, J. Nagle, and J.-P. Landesman, J. Appl. Phys. 93, 1848 (2003).
39. P. D. Colbourne and D. T. Cassidy, IEEE J. Quantum Electron. 27, 914 (1991).
40. P. D. Colbourne and D. T. Cassidy, IEEE J. Quantum Electron. 29, 62 (1993).
41. A. Bercha, P. Adamiec, F. Dyballa, R. Bohdan, and W. Trzeciakowski, Proc. SPIE 4986, 613 (2003).
42. A. Suski, Appl. Phys. Lett. 84, 1236 (2004).
43. D. L. Smith and C. Mailhiot, Phys. Rev. B 33, 8345 (1986).
44. M. L. Biermann and C. R. Stroud, Jr., Appl. Phys. Lett. 58, 505 (1991).
45. P. O. Löwdin, J. Chem. Phys. 19, 1396 (1951).
46. D. A. B. Miller, D. S. Chemla, T. C. Damen, A. A. Gossard, W. Wiegmann, T. H. Wood, and C. A. Burrus, Phys. Rev. Lett. 53, 2173 (1984).
47. S. Schmitt-Rink, D. S. Chemla, and D. A. B. Miller, Adv. Phys. 38, 89 (1989).
48. Mark L. Biermann, James Diaz-Barriga, and W. S. Rabinovich, IEEE J. Quantum Electron. 39, 401 (2003).
49. Mark L. Biermann and W. S. Rabinovich, Opt. Express 10, 1105 (2002).
50. C. J. van der Poel, H. P. M. M. Ambrosius, R. W. M. Linders, R. M. L. Peeters, G. A. Acket, and M. P. C. M. Krijn, Appl. Phys. Lett. 63, 2312 (1993).