SCOPUS 정보 검색 플랫폼

Materials Science and Engineering: B

Volumn 91-92, Issue , 2002, Pages 55-61

Micro-photoluminescence for the visualisation of defects, stress and temperature profiles in high-power III-V's devices

(1) Landesman, Jean Pierre a

a INSTITUT DES MATÉRIAUX JEAN ROUXEL (France)

Author keywords

High power devices; Laser diodes; Mapping; Mechanical stress; Micro photoluminescence; Temperature; Transistors

Indexed keywords

CRYSTAL DEFECTS; MICROWAVE DEVICES; PHOTOLUMINESCENCE; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR LASERS; STRESS ANALYSIS; THERMAL EFFECTS; TRANSISTORS;

LASER DIODE ARRAYS;

SEMICONDUCTOR DEVICES;

EID: 0037197428 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-5107(01)00969-2 Document Type: Conference Paper

Times cited : (12)

References (28)

1
- 0004080617
- Academic Press, New York
- (1993) Optical Characterization of Semiconductors: Infrared, Raman and Photoluminescence Spectroscopy
- Perkowitz, S.¹

2
- 21544462922
- (1994) J. Appl. Phys. , vol.75 , pp. 4779
- Pavesi, L.¹ Guzzi, M.²

3
- 77957062535
- R.K. Williardson, A.C. Beer (Eds.) Academic Press, New York
- (1972) Semiconductors and Semimetals , vol.8 , pp. 181
- Bebb, H.B.¹ Williams, E.W.²

4
- 0003443049
- Dover, New York
- (1975) Optical Processes in Semiconductors
- Pankove, J.I.¹

5
- 85166377545
- Cambridge
- (1993) Solid State Luminescence, Chapman and Hall
- Kitai, A.H.¹

6
- 0021466635
- (1984) J. Appl. Phys. , vol.56 , pp. 463
- Kawai, H.¹ Kaneko, K.² Watanabe, N.³

7
- 0006372175
- (1985) Appl. Phys. Lett. , vol.46 , pp. 1161
- Marsh, J.H.¹ Roberts, J.S.² Claxton, P.A.³

8
- 36549091705
- (1987) Appl. Phys. Lett. , vol.51 , pp. 505
- Kuech, T.F.¹ Wolford, D.J.² Potenski, R.³ Bradley, J.A.⁴ Kelleher, K.H.⁵ Yan, D.⁶ Farrell, J.P.⁷ Lesser, P.M.S.⁸ Pollack, F.⁹

9
- 0006277558
- (1989) J. Vac. Sci. Technol. B , vol.7 , pp. 704
- Munnix, S.¹ Bauer, R.K.² Bimberg, D.³ Harris, J.S.⁴ Köhrbrück, R.⁵ Larkins, E.C.⁶ Maierhofer, C.⁷ Mars, D.E.⁸ Miller, J.N.⁹

10
- 0000230685
- (1991) Phys. Rev. B , vol.44 , pp. 13404
- Roach, W.P.¹ Chandrasekhar, M.² Chandrasekhar, H.R.³ Chambers, F.A.⁴

11
- 0031370091
- (1998) Mater. Res. Soc. Symp. Proc. , vol.484 , pp. 625
- Jimenez, J.¹ Fornari, R.² Curti, M.³ De la Puente, E.⁴ Avella, M.⁵ Sanz, L.F.⁶ Gonzalez, M.A.⁷ Alvarez, A.⁸

12
- 0000944412
- (2000) J. Appl. Phys. , vol.88 , pp. 5225
- Fornari, R.¹ Görög, T.² Jimenez, J.³ De la Puente, E.⁴ Avella, M.⁵ Grant, I.⁶ Brozel, M.⁷ Nicholls, M.⁸

13
- 0026747414
- (1992) Semicond. Sci. Technol. , vol.7
- Miner, C.J.¹

14
- 33751295435
- (1987) Phys. Rev. B , vol.36 , pp. 1581
- Goñi, A.R.¹ Strössner, K.² Syassen, K.³ Cardona, M.⁴

15
- 36549099637
- (1989) J. Appl. Phys. , vol.66 , pp. 196
- Landa, G.¹ Carles, R.² Fontaine, C.³ Bedel, E.⁴ Muñoz-Yagüe, A.⁵

16
- 0020193772
- (1982) J. Appl. Phys. , vol.53
- Blakemore, J.S.¹

17
- 0001124958
- (1995) Rev. Sci. Instrum. , vol.66 , pp. 3738
- Kasai, J.¹ Katayama, Y.²

18
- 0001669299
- (1999) Appl. Phys. Lett. , vol.75 , pp. 2521
- Martin, E.¹ Landesman, J.P.² Hirtz, J.P.³ Fily, A.⁴

19
- 0033898970
- (2000) Proc. SPIE , vol.3945 , pp. 308
- Martin, P.¹ Landesman, J.P.² Martin, E.³ Fily, A.⁴ Hirtz, J.P.⁵ Bisaro, R.⁶

20
- 0001541144
- (1992) Appl. Phys. Lett. , vol.61 , pp. 384
- Hall, D.C.¹ Goldberg, L.² Mehuys, D.³

21
- 0028762155
- (1994) Appl. Phys. Lett. , vol.64 , pp. 13
- Dabkowski, F.P.¹ Chin, A.K.² Gavrilovic, P.³ Alie, S.⁴ Beyea, D.M.⁵

22
- 0030422480
- (1996) J. Appl. Phys. , vol.80 , pp. 6547
- Rommel, J.M.¹ Gavrilovic, P.² Dabkowski, F.P.³

23
- 0030081591
- (1996) Semicond. Sci. Technol. , vol.11 , pp. 139
- De Wolf, I.¹

24
- 0006337729
- European Communities, Luxembourg and references therein
- (1998) Raman and Luminescence Spectroscopy for Microelectronics
- De Wolf, I.¹ Jimenez, J.² Landesman, J.P.³ Frigeri, C.⁴ Braun, P.⁵ Da Silva, E.⁶ Calvet, E.⁷

25
- 0032027073
- (1998) Appl. Phys. Lett. , vol.72 , pp. 1338
- Landesman, J.P.¹ Depret, B.² Fily, A.³ Nagle, J.⁴ Braun, P.⁵

26
- 0032083672
- (1998) Microelectron. Reliab. , vol.38 , pp. 1245
- Martin, E.¹ Landesman, J.P.² Braun, P.³ Fily, A.⁴

27
- 85166373364
- TH8474C-TBR
- (2000) Proc. IEEE
- Landesman, J.P.¹ Floriot, D.² Martin, E.³ Bisaro, R.⁴ Delage, S.L.⁵ Braun, P.⁶

28
- 0006311703
- Vancouver, Canada
- (1999) Tech. Dig. GaAs 99 Conference , pp. 246
- Delage, S.L.¹ Cassette, S.² Di Forte-Poisson, M.A.³ Floriot, D.⁴ Chartier, E.⁵ Etienne, P.⁶ Galtier, P.⁷ Landesman, J.P.⁸

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.