Spatially resolved spectroscopic strain measurements on high-power laser diode bars

Journal of Applied Physics

Volumn 93, Issue 3, 2003, Pages 1354-1362

  Tomm, J W ^a   Gerhardt, A ^a   Muller R ^a   Malyarchuk, V ^a   Sainte Marie, Y ^b   Galtier, P ^b   Nagle, J ^b   Landesman, J P ^c  

^a MAX BORN INSTITUT   (Germany)

^b THALES RESEARCH AND TECHNOLOGY   (France)

^c INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; ELECTROLUMINESCENCE; HIGH POWER LASERS; PHONONS; PHOTOCURRENTS; PHOTOLUMINESCENCE; RAMAN SPECTROSCOPY; SEMICONDUCTING GALLIUM; SOLDERING; STRAIN MEASUREMENT; THERMAL EXPANSION;

MICROPHOTOLUMINESCENCE SPECTROSCOPY;

SEMICONDUCTOR LASERS;

EID: 0037321785     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1533091     Document Type: Article

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