-
1
-
-
0032313960
-
Extensions of the burst generation rate method for wider application to proton/neutron-induced single event effects
-
Dec
-
E. Normand, "Extensions of the burst generation rate method for wider application to proton/neutron-induced single event effects," IEEE Trans. Nucl. Sci, vol. 45, Dec. 1998.
-
(1998)
IEEE Trans. Nucl. Sci
, vol.45
-
-
Normand, E.1
-
2
-
-
0033335620
-
Simulation technologies for cosmic ray neutron-induced soft errors: Models and simulation systems
-
Jun
-
Y. Tosaka, H. Kanata, T. Itakura, and S. Satoh, "Simulation technologies for cosmic ray neutron-induced soft errors: Models and simulation systems," IEEE Trans. Nucl. Sci, vol. 46, no. 3, Jun. 1999.
-
(1999)
IEEE Trans. Nucl. Sci
, vol.46
, Issue.3
-
-
Tosaka, Y.1
Kanata, H.2
Itakura, T.3
Satoh, S.4
-
3
-
-
0033332803
-
Use of new ENDF/B-VI proton and neutron cross section for single event upset calculations
-
M. B. Chadwick and E. Normand, "Use of new ENDF/B-VI proton and neutron cross section for single event upset calculations," IEEE Trans. Nucl. Sci., vol. 46, pp. 1386-1386, 1999.
-
(1999)
IEEE Trans. Nucl. Sci.
, vol.46
, pp. 1386-1386
-
-
Chadwick, M.B.1
Normand, E.2
-
4
-
-
11044232002
-
SEMM2: A modelling system for single event analysis
-
H. H. K. Tang and E. H. Cannon, "SEMM2: A modelling system for single event analysis," IEEE Trans. Nucl. Sci., vol. 51, 2004.
-
(2004)
IEEE Trans. Nucl. Sci.
, vol.51
-
-
Tang, H.H.K.1
Cannon, E.H.2
-
5
-
-
0034290514
-
Proton SEU cross sections derived from heavy ion test data
-
L. D. Edmonds, "Proton SEU cross sections derived from heavy ion test data," IEEE Trans. Nucl. Sci., vol. 47, 2000.
-
(2000)
IEEE Trans. Nucl. Sci.
, vol.47
-
-
Edmonds, L.D.1
-
6
-
-
0035722021
-
Detailed analysis of secondary ions effects for the calculation of neutron-induced ser in SRAMs
-
G. Hubert, J.-M. Palau, K. Castellani-Coulie, M.-C. Calvet, and S. Fourtine, "Detailed analysis of secondary ions effects for the calculation of neutron-induced SER in SRAMs," IEEE Trans. Nucl. Sci., vol. 48, 2001.
-
(2001)
IEEE Trans. Nucl. Sci.
, vol.48
-
-
Hubert, G.1
Palau, J.-M.2
Castellani-Coulie, K.3
Calvet, M.-C.4
Fourtine, S.5
-
7
-
-
33745498267
-
Review of dasie family code: Contribution to SEU/MBU understanding
-
G. Hubert, N. Buard, C. Weulersse, T. Carriere, M.-C. Palau, J.-M. Palau, D. Lambert, J. Baggio, F. Wrobel, F. Saigne, and R. Gaillard, "Review of dasie family code: Contribution to SEU/MBU understanding," presented at the 11th IEEE Int. Symp. One-Line Testing, 2005.
-
(2005)
11th IEEE Int. Symp. One-Line Testing
-
-
Hubert, G.1
Buard, N.2
Weulersse, C.3
Carriere, T.4
Palau, M.-C.5
Palau, J.-M.6
Lambert, D.7
Baggio, J.8
Wrobel, F.9
Saigne, F.10
Gaillard, R.11
-
8
-
-
58849097167
-
Integrating circuit level simulation and Monte-Carlo radiation transport code for single event upset analysis in SEU hardened circuitry
-
K. M. Warren, A. L. Sternberg, R. A. Weller, M. P. Baze, L. W. Massengill, R. A. Reed, M. H. Mendenhall, and R. D. Schrimpf, "Integrating circuit level simulation and Monte-Carlo radiation transport code for single event upset analysis in SEU hardened circuitry," IEEE Trans. Nucl. Sci., vol. 55, pp. 2886-2894.
-
IEEE Trans. Nucl. Sci.
, vol.55
, pp. 2886-2894
-
-
Warren, K.M.1
Sternberg, A.L.2
Weller, R.A.3
Baze, M.P.4
Massengill, L.W.5
Reed, R.A.6
Mendenhall, M.H.7
Schrimpf, R.D.8
-
9
-
-
51549101464
-
Predicting neutron induced soft error rates: Evaluation of accelerated ground based test methods
-
Phoenix, AZ
-
K. M. Warren, J. D. Wilkinson, R. A. Weller, B. D. Sierawski, R. A. Reed, M. E. Porter, M. H. Mendenhall, R. D. Schrimpf, and L. W. Massengill, "Predicting neutron induced soft error rates: Evaluation of accelerated ground based test methods," presented at the IEEE 46th Ann. Int. Symp. Reliability Physics, Phoenix, AZ, 2008.
-
(2008)
IEEE 46th Ann. Int. Symp. Reliability Physics
-
-
Warren, K.M.1
Wilkinson, J.D.2
Weller, R.A.3
Sierawski, B.D.4
Reed, R.A.5
Porter, M.E.6
Mendenhall, M.H.7
Schrimpf, R.D.8
Massengill, L.W.9
-
10
-
-
0031358696
-
Predictions and observations of SEU rates in space
-
Dec
-
E. L. Petersen, "Predictions and observations of SEU rates in space," IEEE Trans. Nucl. Sci., vol. 44, no. 6, Dec. 1997.
-
(1997)
IEEE Trans. Nucl. Sci.
, vol.44
, Issue.6
-
-
Petersen, E.L.1
-
11
-
-
0034205853
-
Study of basic mechanisms induced by an ionizing particle on simple structures
-
G. Hubert, J.-M. Palau, R. Roche Ph, B. Sagnes, J. Gasiot, and M. C. Calvet, "Study of basic mechanisms induced by an ionizing particle on simple structures," IEEE Trans. Nucl. Sci., vol. 47, pp. 519-526, 2000.
-
(2000)
IEEE Trans. Nucl. Sci.
, vol.47
, pp. 519-526
-
-
Hubert, G.1
Palau, J.-M.2
Roche Ph, R.3
Sagnes, B.4
Gasiot, J.5
Calvet, M.C.6
-
12
-
-
0035309017
-
Device simulation study of the SEU sensitivity of SRAM's to internal ion tracks generated by nuclear reactions
-
J.-M. Palau, G. Hubert, K. Coulie, B. Sagnes, C. Calvet, and S. Four- tine, "Device simulation study of the SEU sensitivity of SRAM's to internal ion tracks generated by nuclear reactions," IEEE Trans. Nucl. Sci., vol. 48, pp. 225-231, 2001.
-
(2001)
IEEE Trans. Nucl. Sci.
, vol.48
, pp. 225-231
-
-
Palau, J.-M.1
Hubert, G.2
Coulie, K.3
Sagnes, B.4
Calvet, C.5
Fourtine, S.6
-
13
-
-
0036947691
-
In-Flight observations of the radiation environment and its effects on devices int the SAC-C polar orbit
-
Dec
-
D. Falguere, D. Boscher, T. Nuns, S. Duzellier, S. Bourdarie, R. Ecoffet, S. Barde, J. Cueto, C. Alonzo, and C. Hoffman, "In-Flight observations of the radiation environment and its effects on devices int the SAC-C polar orbit," IEEE Trans. Nucl. Sci., vol. 49, no. 6, Dec. 2002.
-
(2002)
IEEE Trans. Nucl. Sci.
, vol.49
, Issue.6
-
-
Falguere, D.1
Boscher, D.2
Nuns, T.3
Duzellier, S.4
Bourdarie, S.5
Ecoffet, R.6
Barde, S.7
Cueto, J.8
Alonzo, C.9
Hoffman, C.10
-
14
-
-
33748352988
-
Memories response to MBU and semi-empirical approach for SEE rate calculation
-
S. Petit, J. P. David, D. Falguere, S. Duzellier, C. Inguimbert, T. Nuns, and R. Ecoffet, "Memories response to MBU and semi-empirical approach for SEE rate calculation," IEEE Trans. Nucl. Sci., vol. 53, pp. 1787-1793, 2006.
-
(2006)
IEEE Trans. Nucl. Sci.
, vol.53
, pp. 1787-1793
-
-
Petit, S.1
David, J.P.2
Falguere, D.3
Duzellier, S.4
Inguimbert, C.5
Nuns, T.6
Ecoffet, R.7
-
15
-
-
37249067108
-
Monte-Carlo based on-orbit single event upset rate prediction for a radiation hardened by design latch
-
Dec
-
K. M. Warren, B. D. Sierawski, R. A. Reed, R. A. Weller, C. Carmichael, A. Lesea, M. H. Mendenhall, P. E. Dodd, R. D. Schrimpf, L. W. Massengill, T. Hoang, H. Wan, J. L. De Jong, R. Padovani, and J. J. Fabula, "Monte-Carlo based on-orbit single event upset rate prediction for a radiation hardened by design latch," IEEE Trans. Nucl. Sci, vol. 54, no. 6, Dec. 2007.
-
(2007)
IEEE Trans. Nucl. Sci
, vol.54
, Issue.6
-
-
Warren, K.M.1
Sierawski, B.D.2
Reed, R.A.3
Weller, R.A.4
Carmichael, C.5
Lesea, A.6
Mendenhall, M.H.7
Dodd, P.E.8
Schrimpf, R.D.9
Massengill, L.W.10
Hoang, T.11
Wan, H.12
De Jong, J.L.13
Padovani, R.14
Fabula, J.J.15
-
16
-
-
34548071611
-
Application of RADSAFE to model single event upset response of a 0.25 m CMOS SRAM
-
Aug
-
K. M. Warren, R. A. Weller, B. D. Sierawski, R. A. Reed, M. H. Mendenhall, R. D. Schrimpf, L. W. Massengill, M. E. Porter, J. D. Wilkinson, K. A. LaBel, and J. H. Adams, "Application of RADSAFE to model single event upset response of a 0.25 m CMOS SRAM," IEEE Trans. Nucl. Sci., vol. 54, no. 4, pp. 898-903, Aug. 2007.
-
(2007)
IEEE Trans. Nucl. Sci.
, vol.54
, Issue.4
, pp. 898-903
-
-
Warren, K.M.1
Weller, R.A.2
Sierawski, B.D.3
Reed, R.A.4
Mendenhall, M.H.5
Schrimpf, R.D.6
Massengill, L.W.7
Porter, M.E.8
Wilkinson, J.D.9
Label, K.A.10
Adams, J.H.11
-
17
-
-
72349098471
-
-
[Online]. Available
-
GEANT4 [Online]. Available: http://geant4.web.cern.ch/geant4/
-
-
-
-
18
-
-
72349088160
-
-
[Online]. Available
-
The Stopping and Range of Ions in Matter, SRIM [Online]. Available: http://www.srim.org/
-
-
-
-
19
-
-
80052770802
-
Collected charge analysis for a new advanced transient model by TCAD simulation in 90 nm technology
-
RADECS 2009
-
L. Artola, G. Hubert, F. Bezerra, S. Duzellier, and K. Castellani-Coulie, "Collected charge analysis for a new advanced transient model by TCAD simulation in 90 nm technology," presented at the Radiation and Its Effects on Components and Systems, 2009, RADECS 2009.
-
(2009)
Radiation and Its Effects on Components and Systems
-
-
Artola, L.1
Hubert, G.2
Bezerra, F.3
Duzellier, S.4
Castellani-Coulie, K.5
-
20
-
-
0030128574
-
-
P. E. Dodd, "Device simulation of charge collection and single event upset," IEEE Trans. Nucl. Sci., vol. 43, pp. 561-575, 1996.
-
(1996)
IEEE Trans. Nucl. Sci.
, vol.43
, pp. 561-575
-
-
Dodd, P.E.1
-
21
-
-
0029536513
-
Critical charge concepts for CMOS SRAMs
-
Dec
-
P. E. Dodd and F. W. Sexton, "Critical charge concepts for CMOS SRAMs," IEEE Trans. Nucl. Sci., vol. 42, no. 6, pp. 1764-1771, Dec. 1995.
-
(1995)
IEEE Trans. Nucl. Sci.
, vol.42
, Issue.6
, pp. 1764-1771
-
-
Dodd, P.E.1
Sexton, F.W.2
-
22
-
-
0028697670
-
Three-dimensional simulation of charge collection and multiple-bit upset in Si devices
-
P. E. Dodd, F. W. Sexton, and P. S. Winokur, "Three-dimensional simulation of charge collection and multiple-bit upset in Si devices," IEEE Trans. Nucl. Sci., vol. 41, pp. 2005-2017, 1994.
-
(1994)
IEEE Trans. Nucl. Sci.
, vol.41
, pp. 2005-2017
-
-
Dodd, P.E.1
Sexton, F.W.2
Winokur, P.S.3
-
23
-
-
49749132517
-
Investigation of process impact on soft error susceptibility of nanometric SRAMs using a compact critical charge model
-
S. M. Jahinuzzaman, M. Sharifkhani, and M. Sachdev, "Investigation of process impact on soft error susceptibility of nanometric SRAMs using a compact critical charge model," presented at the 9th Int. Symp. Quality Electronic Design, 2008.
-
(2008)
9th Int. Symp. Quality Electronic Design
-
-
Jahinuzzaman, S.M.1
Sharifkhani, M.2
Sachdev, M.3
-
24
-
-
27644435667
-
Criterion for SEU occurrence in SRAM deduced from circuit and device simulations in case ofneutron-induced ser
-
Apr
-
T. Merelle, H. Chabane, J.-M. Palau, K. Castellani-Coulie, F. Wrobel, F. Saigne, B. Sagnes, J. Boch, J. R. Vaille, G. Gasiot, P. Roche, M.-C. Palau, and Palau Carriere, "Criterion for SEU occurrence in SRAM deduced from circuit and device simulations in case ofneutron-induced SER," IEEE Trans. Nucl. Sci., vol. 52, no. 2, Apr. 2005.
-
(2005)
IEEE Trans. Nucl. Sci.
, vol.52
, Issue.2
-
-
Merelle, T.1
Chabane, H.2
Palau, J.-M.3
Castellani-Coulie, K.4
Wrobel, F.5
Saigne, F.6
Sagnes, B.7
Boch, J.8
Vaille, J.R.9
Gasiot, G.10
Roche, P.11
Palau, M.-C.12
Carriere, P.13
-
25
-
-
0031338738
-
Proton upset rate simulation by a Monte Carlo method: Importance of the elastic scattering mechanism
-
Dec
-
C. Inguimbert, S. Duzellier, R. Ecoffet, and J. Bourrieau, "Proton upset rate simulation by a Monte Carlo method: Importance of the elastic scattering mechanism," IEEE Trans. Nucl. Sci., vol. 44, no. 6, pt. 1, pp. 2243-2249, Dec. 1997.
-
(1997)
IEEE Trans. Nucl. Sci.
, vol.44
, Issue.6 PART 1
, pp. 2243-2249
-
-
Inguimbert, C.1
Duzellier, S.2
Ecoffet, R.3
Bourrieau, J.4
-
26
-
-
33748347937
-
DASIE analytical version: A predictive tool for neutrons, protons and heavy ions induced SEU cross section
-
Aug
-
C. Weulersse, G. Hubert, G. Forget, N. Buard, T. Carriere, P. Heins, J. M. Palau, F. Saigne, and R. Gaillard, "DASIE analytical version: A predictive tool for neutrons, protons and heavy ions induced SEU cross section," IEEE Trans. Nucl. Sci., vol. 53, no. 4, pt. 1, pp. 1876-1882, Aug. 2006.
-
(2006)
IEEE Trans. Nucl. Sci.
, vol.53
, Issue.4 PART 1
, pp. 1876-1882
-
-
Weulersse, C.1
Hubert, G.2
Forget, G.3
Buard, N.4
Carriere, T.5
Heins, P.6
Palau, J.M.7
Saigne, F.8
Gaillard, R.9
-
27
-
-
0030361817
-
An empirical model for predicting proton induced upset
-
Dec
-
P. Calvel, C. Barillot, P. Lamothe, R. Ecoffet, S. Duzellier, and D. Falguere, "An empirical model for predicting proton induced upset," IEEE Trans. Nucl. Sci., vol. 43, no. 6, pt. 1, pp. 2827-2832, Dec. 1996.
-
(1996)
IEEE Trans. Nucl. Sci.
, vol.43
, Issue.6 PART 1
, pp. 2827-2832
-
-
Calvel, P.1
Barillot, C.2
Lamothe, P.3
Ecoffet, R.4
Duzellier, S.5
Falguere, D.6
-
32
-
-
84962180292
-
Heavy ion/proton test results on high integrated memories
-
S. Duzellier, D. FaIguere, and R. Ecoffet, "Heavy ion/proton test results on high integrated memories," in Proc. IEEE Radiation Effects Data Workshop Record, 1993, pp. 36-36.
-
(1993)
Proc. IEEE Radiation Effects Data Workshop Record
, pp. 36-36
-
-
Duzellier, S.1
Faiguere, D.2
Ecoffet, R.3
-
33
-
-
84937079881
-
Heavy ions test results on memories
-
R. Ecoffet, M. Labrunee, S. Duzellier, and D. Falguere, "Heavy ions test results on memories," in Proc. IEE Radiation Effects Data Workshop Record, 1992, pp. 27-27.
-
Proc. IEE Radiation Effects Data Workshop Record
, vol.1992
, pp. 27-27
-
-
Ecoffet, R.1
Labrunee, M.2
Duzellier, S.3
Falguere, D.4
-
34
-
-
80052731335
-
ICARE on-board SAC-C: More than 8 years of SEU & MBU, analysis and prediction
-
C. Boatella-Polo, G. Hubert, R. Ecoffet, and F. Bezerra, "ICARE on-board SAC-C: More than 8 years of SEU & MBU, analysis and prediction," presented at the Radiation and its Effects on Components and Systems RADECS, 2009.
-
(2009)
Radiation and Its Effects on Components and Systems RADECS
-
-
Boatella-Polo, C.1
Hubert, G.2
Ecoffet, R.3
Bezerra, F.4
-
35
-
-
21644436688
-
High performance and low power transistors integrated in 65 nm bulk CMOS technology
-
San Fransisco, CA, Dec
-
Z. Luo, A. Steegen, M. Eller, R. Mann, C. Baiocco, P. Nguyen, L. Kim, M. Hoinkis, V. Ku, V. Klee, F. Jamin, P. Wrschka, P. Shafer, W. Lin, S. Fang, A. Ajmera, W. Tan, D. Park, R. Mo, J. Lian, D. Vietzke, C. Coppock, A. Vayshenker, T. Hook, V. Chan, K. Kim, A. Cowley, S. Kim, E. Kaltalioglu, B. Zhang, S. Marokkey, Y. Lin, K. Lee1, H. Zhu, M. Weybright, R. Rengarajan, J. Ku, T. Schiml, J. Sudijono, I. Yang, and C. Wann, "High performance and low power transistors integrated in 65 nm bulk CMOS technology," presented at the Int. Electron Device Meeting Tech. Digest, San Fransisco, CA, Dec. 2004.
-
(2004)
Int. Electron Device Meeting Tech. Digest
-
-
Luo, Z.1
Steegen, A.2
Eller, M.3
Mann, R.4
Baiocco, C.5
Nguyen, P.6
Kim, L.7
Hoinkis, M.8
Ku, V.9
Klee, V.10
Jamin, F.11
Wrschka, P.12
Shafer, P.13
Lin, W.14
Fang, S.15
Ajmera, A.16
Tan, W.17
Park, D.18
Mo, R.19
Lian, J.20
Vietzke, D.21
Coppock, C.22
Vayshenker, A.23
Hook, T.24
Chan, V.25
Kim, K.26
Cowley, A.27
Kim, S.28
Kaltalioglu, E.29
Zhang, B.30
Marokkey, S.31
Lin, Y.32
Leel, K.33
Zhu, H.34
Weybright, M.35
Rengarajan, R.36
Ku, J.37
Schiml, T.38
Sudijono, J.39
Yang, I.40
Wann, C.41
more..
-
36
-
-
58849117603
-
Low energy proton single-event-upset test results on 65 nm SOI SRAM
-
Dec
-
D. F. Heidel, P. W. Marshall, K. A. LaBel, J. R. Schwank, K. P. Rodbell, M. C. Hakey, M. D. Berg, P. E. Dodd, M. R. Friendlich, A. D. Phan, C. M. Seidleck, M. R. Shaneyfelt, and M. A. Xapsos, "Low energy proton single-event-upset test results on 65 nm SOI SRAM," IEEE Trans. Nucl. Sci., vol. 55, no. 6, Dec. 2008.
-
(2008)
IEEE Trans. Nucl. Sci.
, vol.55
, Issue.6
-
-
Heidel, D.F.1
Marshall, P.W.2
Label, K.A.3
Schwank, J.R.4
Rodbell, K.P.5
Hakey, M.C.6
Berg, M.D.7
Dodd, P.E.8
Friendlich, M.R.9
Phan, A.D.10
Seidleck, C.M.11
Shaneyfelt, M.R.12
Xapsos, M.A.13
-
37
-
-
45749130595
-
Alpha-particle-induced upsets in advanced CMOS circuits and technology
-
D. F. Heidel, K. P. Rodbell, E. H. Cannon, C. Cabral, Jr, M. S. Gordon, P. Oldiges, and H. H. K. Tang, "Alpha-particle-induced upsets in advanced CMOS circuits and technology," IBM J. Res. Dev., vol. 52, no. 3, 2008.
-
(2008)
IBM J. Res. Dev.
, vol.52
, Issue.3
-
-
Heidel, D.F.1
Rodbell, K.P.2
Cannon, E.H.3
Cabral Jr, C.4
Gordon, M.S.5
Oldiges, P.6
Tang, H.H.K.7
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