Detailed analysis of secondary ions' effect for the calculation of neutron-induced SER in SRAMs

IEEE Transactions on Nuclear Science

Volumn 48, Issue 6 I, 2001, Pages 1953-1959

  Hubert, G ^a,b   Palau, J M ^a,b   Castellani Coulie K ^b   Calvet, M C ^a,c   Fourtine, S ^c  

^a IEEE   (France)

^b UNIV MONTPELLIER   (France)

^c AIRBUS GROUP INNOVATIONS   (Germany)

Author keywords

Detailed analysis of secondary ions; Neutron; Sensitive volume; Single event upset (SEU); Soft error rate; SRAM

Indexed keywords

NUCLEAR REACTIONS; SINGLE EVENT UPSET (SEU); SOFT ERROR RATES;

ATOMS; COMPUTER SIMULATION; ENERGY TRANSFER; NEUTRONS; SILICON; STATIC RANDOM ACCESS STORAGE;

NUCLEAR PHYSICS;

EID: 0035722021     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.983156     Document Type: Conference Paper

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