SEMM-2: A modeling system for single event upset analysis

IEEE Transactions on Nuclear Science

Volumn 51, Issue 6 II, 2004, Pages 3342-3348

  Tang, Henry H K ^a   Cannon, Ethan H ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM   (United States)

Author keywords

Alpha particle , proton , neutron , high energy hadron , cosmic ray , and heavy ion induced radiation in microelectronics; CMOS technology stability and reliability; Particle induced soft errors; Radiation effects; Single event upsets

Indexed keywords

COMPUTER SIMULATION; COSMIC RAYS; DATABASE SYSTEMS; ERROR ANALYSIS; HEAVY IONS; MICROELECTRONICS; NEUTRONS; PROTONS; RADIATION EFFECTS;

ALPHA PARTICLE; CMOS TECHNOLOGY STABILITY AND RELIABILITY; HEAVY ION-INDUCED RADIATION IN MICROELECTRONICS; HIGH-ENERGY HADRON; PARTICLE-INDUCED SOFT ERRORS; RADIATION EFFECTS MODELING METHODOLOGY AND SIMULATION TOOLS; SINGLE EVENT UPSETS;

CMOS INTEGRATED CIRCUITS;

EID: 11044232002     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.839507     Document Type: Conference Paper

References (16)

1. G. R. Srinivasan, H. K. Tang, and P. C. Murley, "Parameter-free, predictive modeling of single event upsets due to protons, neutrons, and pions in terrestrial cosmic rays," IEEE Trans. Nucl. Sci., vol. 41, pp. 2063-2070, Dec. 1994.
2. G. R. Srinivasan, P. C. Murley, and H. K. Tang, "Accurate, predictive modeling of soft error rate due to cosmic rays and chip alpha radiation," in Proc. 32nd Annu. Reliability Physics Conf., 1994, pp. 12-16.
3. G. R. Srinivasan, "Modeling the cosmic-ray-induced soft-error rate in integrated circuits: An overview," IBM J. Res. Develop., vol. 40, no. 1, pp. 77-89, Jan. 1996.
4. P. C. Murley and G. R. Srinivisan, "Soft-error Monte Carlo modeling program, SEMM," IBM J. Res. Develop., vol. 40, no. 1, pp. 109-118, Jan. 1996.
5. H. H. K. Tang, "Nuclear physics of cosmic ray interaction with semi-conductor materials: Particle-induced soft errors from a physicist's perspective," IBM J. Res. Develop., vol. 40, no. 1, pp. 91-108, Jan. 1996.
6. H. H. K. Tang, G. R. Srinivasan, and N. Azziz, "Cascade statistical model for nucleon-induced reactions on light nuclei in the energy range 50 MeV-1 GeV," Phys. Rev. C42, no. 4, pp. 1598-1622, 1990.
7. H. H. K. Tang and K. P. Rodbell, "Single-event upsets in microelectronics: Fundamental physics and issues," MRS Bull., vol. 28, pp. 111-116, 2003.
8. R. Baumann, "Impact of single-event upsets in deep-submicron silicon technology," MRS Bull., vol. 28, pp. 117-120, 2003.
9. E. H. Cannon, D. D. Reinhardt, M. S. Gordon, and P. S. Makowenskyj, "SRAM SER in 90, 130, and 180 nm bulk and SOI technologies," in Proc. Int. Reliability Physics Symp., 2004, pp. 300-304.
10. M. S. Gordon, P. Goldhagen, K. P. Rodbell, T. H. Zabel, H. H. K. Tang, J. M. Clem, and P. Bailey, "Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground" IEEE Trans. Nucl. Sci., vol. 51, Dec. 2004.
11. P. Oldiges, K. Bernstein, D. Heidel, B. Klaasen, E. Cannon, R. Dennard, H. Tang, M. Ieong, and H. S. P. Wong, "Soft error rate scaling for emerging SOI technology options," in IEEE Symp. VLSI Technology Dig. Tech. Papers, Honolulu, HI, June 2002, pp. 46-47.
12. J. L. Romero, H. H. K. Tang, D. J. Morrissey, M. Fauerbach, R. Pfaff, C. F. Powell, B. M. Sherrill, F. P. Brady, D. A. Cebra, J. Chance, J. C. Kinter, and J. H. Osborne, "Nucleon-induced secondaries: A review and future experimental developments," in Amer. Inst. Physics Conf. Proc., vol. 392, 1997, pp. 655-658.
13. L. L. Carter and E. D. Cashwell, "Particle-transport simulations with the Monte Carlo method," Technical Information Center Publications, Office of Public Affairs, U.S. Energy Research and Development Administration, Oak Ridge, TN, 1975.
14. Particle Interactions With Matter - The Stopping and Range of Ions in Matter (SRIM), J. Ziegler. [Online]. Available: http://www.srim.org
15. P. Oldiges, R. Dennard, D. Heidel, B. Klaasen, E. Assaderaghi, and M. Ieong, "Theoretical determination of the temporal and spatial structure of alph-particle induced electron-hole pair generation in silicon," IEEE Trans. Nucl. Sci., vol. 47, pp. 2575-2579, Dec. 2000.
16. R. A. Weller, private communication.