Predicting neutron induced soft error rates: Evaluation of accelerated ground based test methods

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2008, Pages 473-477

  Warren, Kevin M ^a   Wilkinson, Jeffrey D ^b   Weller, Robert A ^c   Sierawski, Brian D ^a   Reed, Robert A ^c   Porter, Mark E ^b   Mendenhall, Marcus H ^c   Schrimpf, Ron D ^c   Massengill, Lloyd W ^c  

^a VANDERBILT UNIVERSITY   (United States)

^b MEDTRONIC INC   (United States)

^c VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 51549101464     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2008.4558931     Document Type: Conference Paper

References (12)

1. Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices, JEDEC Standard JESD89A, October 2006.
2. S. Agostinelli, J. Allison, K. Amako, J. Apostolakis, H. Araujo, P. Arce, M. Asai, D. Axen, S. Banerjee, G. Barrand, F. Behner, L. Bellagamba, J. Boudreau, L. Broglia, A. Brunengo, H. Burkhardt, S. Chauvie, J. Chuma, R. Chytracek, G. Cooperman, G. Cosmo, P. Degtyarenko, A. Dell'Acqua, G. Depaola, D. Dietrich, R. Enami, A. Feliciello, C. Ferguson, H. Fesefeldt, G. Folger, F. Foppiano, A. Forti, S. Garelli, S. Giani, R. Giannitrapani, D. Gibin, J.J. Gomez, Cadenas, I. Gonzalez, G. Gracia Abril, G. Greeniaus, W. Greiner, V. Grichine, A. Grossheim, S. Guatelli, P. Gumplinger, R. Hamatsu, K. Hashimoto, H. Hasui, A. Heikkinen, A. Howard, V. Ivanchenko, A. Johnson, F.W. Jones, J. Kallenbach, N. Kanaya, M. Kawabata, Y. Kawabata, M. Kawaguti, S. Kelner, P. Kent, A. Kimura, T. Kodama, R. Kokoulin, M. Kossov, H. Kurashige, E. Lamanna, T. Lampen, V. Lara, V. Lefebure, F. Lei, M. Liendl, W. Lockman, F. Longo, S. Magni, M. Maire, E. Medernach, K. Minamimoto, P. Mora de Freitas, Y. Morita, K. Murakami, M. Nagamatu, R. Nartallo, P. Nieminen, T. Nishimura, K. Ohtsubo, M. Okamura, S. O'Neale, Y. Oohata, K. Paech, J. Perl, A. Pfeiffer, M.G. Pia, F. Ranjard, A. Rybin, S. Sadilov, E. Di Salvo, G. Santin, T. Sasaki, N. Sawas, Y. Sawada, S. Scherer, S. Sei, V. Sirotenko, D. Smith, N. Starkov, H. Stoecker, J. Sulkimo, M. Takahata, S. Tanaka, E. Tcherniaev, E. Safai Tehrani, M. Tropeano, P. Truscott, H. Uno, L. Urban, P. Urban, M. Verderi, A. Walkden, W. Wander, H. Weber, J.P. Wellisch, T. Wenaus, D.C. Williams, D. Wright, T. Yamada, H. Yoshida, D. Zschiesche, "Geant4-a simulation toolkit," Nuc. Instr. And Methods A, vol. 506, p. 250, 2003.
3. Reed, R. A. et al., "Implications of Nuclear Reactions for Single Event Effects Test Methods and Analysis," IEEE Trans Nucl. Sci., Vol. 53, no. 6, Dec. 2006, pp. 3356-3362.
4. Warren, K.M., et al., "Predicting Thermal Neutron-Induced Soft Errors in Static Memories Using TCAD and Physics-Based Monte Carlo Simulation Tools," Electron. Dev. Lett., Vol. 28, no. 2, Feb. 2007. pp. 180-182.
5. J.M. Palau, F. Wrobel, K. Castellani-Coulie, M.C Calvet, P.E. Dodd, and F. W. Sexton, "Monte Carlo Exploration of Neutron-Induced SEU-Sensitive Volumes in SRAMs," IEEE Trans. Nucl. Sci., Vol 49, no. 6, Dec. 2002, pp 3075-3081.
6. P. Truscott, F. Lei, C. Dyer, A. Frydland, S. Clucas, b. Trousse, K. Hunter, C. Comber, A. Chugg, M. Moutrie, "Assessment of Nuetron- and Proton-Induced Nuclear Interaction and Ionization Models in Geant4 for Simulating Single Event Effects," IEEE Trans. Nucl. Sci., Vol. 51, no. 6, Dec. 2004. pp 3369-3374.
7. J.R. Schwank, M.R. Shaneyfelt, J. Baggio, P.E. Dodd, J.A. Felix, V. Ferlet-Cavrois, P. Paillet, D. Lambert, F.W. Sexton, g.L. Hash, and E. Blackmore, "Effects of Particle Energy on Proton-Induced Single-Event Latchup," IEEE Trans. Nucl. Sci., Vol. 52, no. 6. Dec. 2005. pp 2622-2629.
8. J. Baggio, V. Ferlet-Cavrois, H. Duarte, and O. Flament, "Analysis of Proton/Neutron SEU Sensitivity of Commercial SRAMs-Application to the Terrestrial Environment Test Method," IEEE Trans. Nucl. Sci., Vol. 51, no. 6, Dec. 2004. pp. 3420-3426.
9. Warren, K.M., et al., "Application of RADSAFE to Model the Single Event Upset Response of a 0.25 Um CMOS SRAM," IEEE Trans. Nucl. Sci., Vol. 54, no. 4, Aug. 2007. pp. 898-903.
10. C. Inguimbert, S. Duzellier, T. Nuns, and F. Bezerra, "Using Subthreshold Heavy Ion Upset Cross Section to Calculate Proton Sensitivity, " IEEE Trans. Nucl. Sci., Vol 54. no. 6. Dec. 2007. pp 2394-2399.
11. E.W. Caseio, J.M. Sisterson, J.B. Flanx, and M.S. Wagner, "The Proton Irradiation Program at the Northeast Proton Therapy Center," 2003 IEEE Radiation Effects Data Workshop, July 2003. pp 141-144.
12. http://www.accre.vanderbilt.edu