MUSCA SEP3 contributions to investigate the direct ionization proton upset in 65nm technology for space, atmospheric and ground applications

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 2009, Pages 179-186

  Hubert, G ^a   Duzellier, S ^a   Bezerra, F ^b   Ecoffet, R ^b  

^a ONERA   (France)

^b CNES   (France)

Author keywords

direct ionization of proton; nanometric technology; operational SER; space atmospheric ground applications

Indexed keywords

65NM TECHNOLOGY; DIRECT IONIZATION OF PROTON; NANOMETRICS; OPERATIONAL SER; SPACE ATMOSPHERIC GROUND APPLICATIONS;

IONIZATION; NANOTECHNOLOGY; PROTONS; RADIATION EFFECTS;

ATMOSPHERIC IONIZATION;

EID: 80052748314     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RADECS.2009.5994577     Document Type: Conference Paper

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