Memories response to MBU and semi-empirical approach for SEE rate calculation

IEEE Transactions on Nuclear Science

Volumn 53, Issue 4, 2006, Pages 1787-1793

  Petit, S ^a   David, J P ^a   Falguere D ^a   Duzellier, S ^a   Inguimbert, C ^a   Nuns, T ^a   Ecoffet, R ^b  

^a ONERA   (France)

^b CNES   (France)

Author keywords

Multiple bit upset (MBU); Predictions; SEU

Indexed keywords

COMPUTER SIMULATION; DATA ACQUISITION; DATA STORAGE EQUIPMENT; ORBITS;

MULTIPLE BIT UPSET (MBU); PREDICTIONS; SEU;

HIGH ENERGY PHYSICS;

EID: 33748352988     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.872153     Document Type: Conference Paper

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