Monte-Carlo based on-orbit single event upset rate prediction for a radiation hardened by design latch

IEEE Transactions on Nuclear Science

Volumn 54, Issue 6, 2007, Pages 2419-2425

  Warren, Kevin M ^a   Sierawski, Brian D ^a   Reed, Robert A ^a   Weller, Robert A ^a   Carmichael, Carl ^b   Lesea, Austin ^b   Mendenhall, Marcus H ^c   Dodd, Paul E ^d   Schrimpf, Ron D ^a   Massengill, Lloyd W ^a   Hoang, Tan ^b   Wan, Hsing ^b   De Jong, J L ^b   Padovani, Rick ^b   Fabula, Joe J ^b  

^a VANDERBILT UNIVERSITY   (United States)

^b XILINX INC   (United States)

^c VANDERBILT UNIVERSITY   (United States)

^d SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Geant4; MRED; Rate prediction; SEU

Indexed keywords

COMPUTER AIDED DESIGN; ERROR ANALYSIS; MONTE CARLO METHODS; RADIATION HARDENING; SENSITIVITY ANALYSIS; SPICE;

CHARGE COLLECTION; ON-ORBIT ERROR RATE; RATE PREDICTION;

FLIP FLOP CIRCUITS;

EID: 37249067108     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.907678     Document Type: Conference Paper

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