Alpha-particle-induced upsets in advanced CMOS circuits and technology

IBM Journal of Research and Development

Volumn 52, Issue 3, 2008, Pages 225-231

  Heidel, David F ^a   Rodbell, Kenneth P ^a   Cannon, Ethan H ^b   Cabral Jr , Cyril ^a   Gordon, Michael S ^a   Oldiges, Phil ^c   Tang, Henry H K ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM   (United States)

^c IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER NETWORKS; COSMOLOGY; INDUSTRY; TECHNOLOGY;

(OTDR) TECHNOLOGY; ALPHA-PARTICLES; CMOS CIRCUITS; CRITICAL ISSUES; CURRENT STATUS; HIGH PERFORMANCE; HIGH-RELIABILITY; HIGHLY SENSITIVE; INTERNATIONAL BUSINESS; LATCH CIRCUITS; MEMORY CIRCUITS; SINGLE EVENT UPSET (SEU);

FLIP FLOP CIRCUITS;

EID: 45749130595     PISSN: 00188646     EISSN: 00188646     Source Type: Journal    
DOI: 10.1147/rd.523.0225     Document Type: Review

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