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Volumn 78, Issue 21, 2001, Pages 3262-3264

Tracking of conduction phenomena and degradation in organic light emitting diodes by current noise measurements

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0035927182     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1374516     Document Type: Article
Times cited : (22)

References (17)
  • 11
    • 0039487928 scopus 로고    scopus 로고
    • Thesis, Eindhoven University of Technology
    • P. Herve, Thesis, Eindhoven University of Technology, 1997.
    • (1997)
    • Herve, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.