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Volumn 85, Issue 2, 2004, Pages 314-316

Interface states and depletion-induced threshold voltage instability in organic metal-insulator-semiconductor structures

(3) Torres, I a Taylor, D M a Itoh, E a,b

a BANGOR UNIVERSITY (United Kingdom)

b SHINSHU UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRIC ADMITTANCE; ELECTRODES; ELECTRON TRAPS; EVAPORATION; FIELD EFFECT TRANSISTORS; INORGANIC POLYMERS; LIGHTING; SEMICONDUCTING SILICON; SEMICONDUCTOR MATERIALS; THRESHOLD VOLTAGE; VACUUM APPLICATIONS;

BIAS CURRENTS; DEPLETION; GATE INSULATORS; VACUUM EVAPORATION;

METAL INSULATOR BOUNDARIES;

EID: 3242890574 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1769081 Document Type: Article

Times cited : (97)

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