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Volumn 405, Issue 1, 2010, Pages 85-93

A study on structural, optical, electrical and microstructural properties of thin TiOx films upon thermal oxidation: Effect of substrate temperature and oxidation temperature

Author keywords

Optical and electrical properties; RF magnetron sputtering; Scanning electron microscopy; Thermal oxidation; TiOx thin films

Indexed keywords

OPTICAL AND ELECTRICAL PROPERTIES; RF-MAGNETRON SPUTTERING; THERMAL OXIDATION; TIO; TIOX THIN FILMS;

EID: 71849092991     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2009.08.031     Document Type: Article
Times cited : (30)

References (35)
  • 32
    • 0003998388 scopus 로고
    • Lide D.R., and Frederikse H.P.R. (Eds), CRC Press, Boca Raton, FL pp. 4-108
    • In: Lide D.R., and Frederikse H.P.R. (Eds). CRC Handbook of Chemistry and Physics. seventy-fifth ed. (1994), CRC Press, Boca Raton, FL pp. 4-108
    • (1994) CRC Handbook of Chemistry and Physics. seventy-fifth ed.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.