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Volumn 405, Issue 1, 2010, Pages 85-93
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A study on structural, optical, electrical and microstructural properties of thin TiOx films upon thermal oxidation: Effect of substrate temperature and oxidation temperature
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Author keywords
Optical and electrical properties; RF magnetron sputtering; Scanning electron microscopy; Thermal oxidation; TiOx thin films
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Indexed keywords
OPTICAL AND ELECTRICAL PROPERTIES;
RF-MAGNETRON SPUTTERING;
THERMAL OXIDATION;
TIO;
TIOX THIN FILMS;
ACTIVATION ENERGY;
CRYSTALLITE SIZE;
ELECTRIC PROPERTIES;
INTEGRATED OPTOELECTRONICS;
MAGNETRON SPUTTERING;
MAGNETRONS;
ORGANIC POLYMERS;
OXIDATION;
OXIDE MINERALS;
OXYGEN;
REFRACTIVE INDEX;
SCANNING;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
THERMAL EFFECTS;
THIN FILMS;
TITANIUM;
TITANIUM DIOXIDE;
TITANIUM OXIDES;
OPTICAL FILMS;
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EID: 71849092991
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2009.08.031 Document Type: Article |
Times cited : (30)
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References (35)
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