Influence of calcination ambient and film thickness on the optical and structural properties of sol-gel TiO2 thin films

Materials Research Bulletin

Volumn 42, Issue 1, 2007, Pages 177-189

  Sreemany, Monjoy ^a   Sen, Suchitra ^a  

^a CSIR CENTRAL GLASS AND CERAMIC RESEARCH INSTITUTE   (India)

Author keywords

A: Oxides; B: Sol gel chemistry; C: Electron microscopy; D: Microstructure; D: Optical properties

Indexed keywords

AGGLOMERATION; ARGON; CALCINATION; ENERGY GAP; MICROSTRUCTURE; OPTICAL PROPERTIES; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; TITANIUM DIOXIDE; VACUUM APPLICATIONS; X RAY DIFFRACTION ANALYSIS;

BAND GAP ENERGY; CRYSTALLITE SIZE; FILM THICKNESS; SOL GEL CHEMISTRY;

THIN FILMS;

EID: 33845513529     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2006.04.033     Document Type: Article

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