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Volumn 30, Issue 2, 2010, Pages 441-446

CVD elaboration and in situ characterization of barium silicate thin films

Author keywords

Barium; Films; Insulator; Silicate; Spectroscopy

Indexed keywords

BARIUM OXIDES; BARIUM SILICATE; CVD REACTORS; IN-SITU CHARACTERIZATION; INSULATOR; METAL ORGANIC PRECURSORS; METALORGANIC CHEMICAL VAPOR DEPOSITION; X RAY PHOTOEMISSION SPECTROSCOPY;

EID: 70350704481     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2009.05.027     Document Type: Article
Times cited : (4)

References (22)
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  • 6
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    • Wilk G.D., Wallace R.M., and Anthony J.M. Hafnium and zirconium silicates for advanced gate dielectrics. Journal of Applied Physics 87 1 (2000) 484-492
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    • Wilk, G.D.1    Wallace, R.M.2    Anthony, J.M.3
  • 9
    • 33845901794 scopus 로고    scopus 로고
    • Novel monomeric barium complexes as volatile precursors for chemical vapour deposition
    • Hill M.R., Russell J.J., Roberts N.K., and Lamb R.N. Novel monomeric barium complexes as volatile precursors for chemical vapour deposition. Polyhedron 26 (2007) 493-507
    • (2007) Polyhedron , vol.26 , pp. 493-507
    • Hill, M.R.1    Russell, J.J.2    Roberts, N.K.3    Lamb, R.N.4
  • 10
    • 0034525113 scopus 로고    scopus 로고
    • Group 2 element b-diketonate complexes: synthetic and structural investigations
    • Otway D.J., and Rees W.S. Group 2 element b-diketonate complexes: synthetic and structural investigations. Coordination Chemistry Reviews 210 (2000) 279-328
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    • Otway, D.J.1    Rees, W.S.2
  • 15
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    • Kinetics of evaporation of barium THD precursors used for organometallic chemical vapor deposition (OMCVD) thin films
    • Burtman V., Schieber M., Yitzchaik S., and Yaroslavsky Y. Kinetics of evaporation of barium THD precursors used for organometallic chemical vapor deposition (OMCVD) thin films. Journal of Crystal Growth 174 (1997) 801-805
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    • Burtman, V.1    Schieber, M.2    Yitzchaik, S.3    Yaroslavsky, Y.4
  • 21
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    • Angle resolved X-ray photoemission spectroscopy double layer model for in situ characterization of metal organic chemical vapour deposition nanometric films
    • Brevet A., Imhoff L., Marco de Lucas M.C., Domenichini B., and Bourgeois S. Angle resolved X-ray photoemission spectroscopy double layer model for in situ characterization of metal organic chemical vapour deposition nanometric films. Thin Solid Films 515 (2007) 6407-6410
    • (2007) Thin Solid Films , vol.515 , pp. 6407-6410
    • Brevet, A.1    Imhoff, L.2    Marco de Lucas, M.C.3    Domenichini, B.4    Bourgeois, S.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.