-
1
-
-
0035872897
-
High-k gate dielectrics: current status and materials properties considerations
-
Wilk G.D., Wallace R.M., and Anthony J.M. High-k gate dielectrics: current status and materials properties considerations. Journal of Applied Physics 89 10 (2001) 5243-5275
-
(2001)
Journal of Applied Physics
, vol.89
, Issue.10
, pp. 5243-5275
-
-
Wilk, G.D.1
Wallace, R.M.2
Anthony, J.M.3
-
4
-
-
0032516989
-
Intermixing at the tantalum oxide/silicon interface in gate dielectric structures
-
Alers G.B., Werder D.J., Chabal Y., Lu H.C., Gusev E.P., Garfunkel E., et al. Intermixing at the tantalum oxide/silicon interface in gate dielectric structures. Applied Physics Letters 73 (1998) 1517-1519
-
(1998)
Applied Physics Letters
, vol.73
, pp. 1517-1519
-
-
Alers, G.B.1
Werder, D.J.2
Chabal, Y.3
Lu, H.C.4
Gusev, E.P.5
Garfunkel, E.6
-
5
-
-
33646581742
-
Interfacial reaction during MOCVD growth revealed by in situ ARXPS
-
Brevet A., Chassagnon R., Imhoff L., Marco de Lucas M.C., Domenichini B., and Bourgeois S. Interfacial reaction during MOCVD growth revealed by in situ ARXPS. Surface and Interface Analysis 38 (2006) 579-582
-
(2006)
Surface and Interface Analysis
, vol.38
, pp. 579-582
-
-
Brevet, A.1
Chassagnon, R.2
Imhoff, L.3
Marco de Lucas, M.C.4
Domenichini, B.5
Bourgeois, S.6
-
6
-
-
0346534582
-
Hafnium and zirconium silicates for advanced gate dielectrics
-
Wilk G.D., Wallace R.M., and Anthony J.M. Hafnium and zirconium silicates for advanced gate dielectrics. Journal of Applied Physics 87 1 (2000) 484-492
-
(2000)
Journal of Applied Physics
, vol.87
, Issue.1
, pp. 484-492
-
-
Wilk, G.D.1
Wallace, R.M.2
Anthony, J.M.3
-
8
-
-
52049093447
-
Elaboration and characterization of barium silicate films
-
Genevès T., Domenichini B., Imhoff L., Potin V., Heintz O., Peterlé P.M., et al. Elaboration and characterization of barium silicate films. Micron 39 8 (2008) 1145-1148
-
(2008)
Micron
, vol.39
, Issue.8
, pp. 1145-1148
-
-
Genevès, T.1
Domenichini, B.2
Imhoff, L.3
Potin, V.4
Heintz, O.5
Peterlé, P.M.6
-
9
-
-
33845901794
-
Novel monomeric barium complexes as volatile precursors for chemical vapour deposition
-
Hill M.R., Russell J.J., Roberts N.K., and Lamb R.N. Novel monomeric barium complexes as volatile precursors for chemical vapour deposition. Polyhedron 26 (2007) 493-507
-
(2007)
Polyhedron
, vol.26
, pp. 493-507
-
-
Hill, M.R.1
Russell, J.J.2
Roberts, N.K.3
Lamb, R.N.4
-
10
-
-
0034525113
-
Group 2 element b-diketonate complexes: synthetic and structural investigations
-
Otway D.J., and Rees W.S. Group 2 element b-diketonate complexes: synthetic and structural investigations. Coordination Chemistry Reviews 210 (2000) 279-328
-
(2000)
Coordination Chemistry Reviews
, vol.210
, pp. 279-328
-
-
Otway, D.J.1
Rees, W.S.2
-
13
-
-
0028513303
-
Alkaline-earth complexes as precursors for metalorganic chemical vapor deposition
-
Tasaki Y., Sakamoto R., Ogawa Y., Yoshizawa S., Ishiai J., and Akase S. Alkaline-earth complexes as precursors for metalorganic chemical vapor deposition. Japanese Journal of Applied Physics 33 (1994) 5400-5403
-
(1994)
Japanese Journal of Applied Physics
, vol.33
, pp. 5400-5403
-
-
Tasaki, Y.1
Sakamoto, R.2
Ogawa, Y.3
Yoshizawa, S.4
Ishiai, J.5
Akase, S.6
-
15
-
-
0031547280
-
Kinetics of evaporation of barium THD precursors used for organometallic chemical vapor deposition (OMCVD) thin films
-
Burtman V., Schieber M., Yitzchaik S., and Yaroslavsky Y. Kinetics of evaporation of barium THD precursors used for organometallic chemical vapor deposition (OMCVD) thin films. Journal of Crystal Growth 174 (1997) 801-805
-
(1997)
Journal of Crystal Growth
, vol.174
, pp. 801-805
-
-
Burtman, V.1
Schieber, M.2
Yitzchaik, S.3
Yaroslavsky, Y.4
-
21
-
-
34247465513
-
Angle resolved X-ray photoemission spectroscopy double layer model for in situ characterization of metal organic chemical vapour deposition nanometric films
-
Brevet A., Imhoff L., Marco de Lucas M.C., Domenichini B., and Bourgeois S. Angle resolved X-ray photoemission spectroscopy double layer model for in situ characterization of metal organic chemical vapour deposition nanometric films. Thin Solid Films 515 (2007) 6407-6410
-
(2007)
Thin Solid Films
, vol.515
, pp. 6407-6410
-
-
Brevet, A.1
Imhoff, L.2
Marco de Lucas, M.C.3
Domenichini, B.4
Bourgeois, S.5
-
22
-
-
0003459529
-
-
Perkin-Elmer Corporation, Physical Electronics Division
-
Wagner C.D., Riggs W.M., Davis L.E., Moulder J.F., and Muilenberg G.E. Handbook of X-ray Photoelectron Spectroscopy (1979), Perkin-Elmer Corporation, Physical Electronics Division
-
(1979)
Handbook of X-ray Photoelectron Spectroscopy
-
-
Wagner, C.D.1
Riggs, W.M.2
Davis, L.E.3
Moulder, J.F.4
Muilenberg, G.E.5
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