Highly X-tolerant selective compaction of test responses

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2009, Pages 245-250

  Mrugalski, G ^a   Mukherjee, N ^a   Rajski, J ^a   Czysz, D ^b   Tyszer, J ^b  

^a MENTOR GRAPHICS CORPORATION   (United States)

^b POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Output compaction; Scan chain selection; Test data compression; Unknown states; X masking

Indexed keywords

OUTPUT COMPACTION; SCAN CHAIN SELECTION; TEST DATA COMPRESSION; UNKNOWN STATES; X-MASKING;

COMPACTION; TEST FACILITIES; TESTING;

DATA COMPRESSION;

EID: 70350349920     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2009.11     Document Type: Conference Paper

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