X-block: An efficient LFSR reseeding-based method to block unknowns for temporal compactors

IEEE Transactions on Computers

Volumn 57, Issue 7, 2008, Pages 978-989

  Wang, Seongmoon ^a   Balakrishnan, Kedarnath J ^b   Wei, Wenlong ^a  

^a NEC LABORATORIES AMERICA   (United States)

^b ADVANCED MICRO DEVICES   (United States)

Author keywords

Blocking unknowns; Output compaction; Test data compression; Unknown masking

Indexed keywords

BLOCKING UNKNOWNS; CONTROL DATUM; CONTROL SIGNALS; EFFICIENT METHODS; FAULT EFFECTS; HARDWARE OVERHEADS; INDUSTRIAL CIRCUITS; LINEAR FEEDBACK-SHIFT REGISTERS; LINEAR SOLVERS; ORDERS OF MAGNITUDES; OUTPUT COMPACTION; RUN-TIME; TEST DATA COMPRESSION; TEST PATTERNS; TEST QUALITIES; UNKNOWN MASKING; UNKNOWN VALUES;

COMPACTION; SHIFT REGISTERS; TEST FACILITIES; TESTING;

DATA COMPRESSION;

EID: 54949130296     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.2007.70833     Document Type: Article

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