Automated data analysis solutions to silicon debug

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2009, Pages 982-987

  Yang, Yu Shen ^a   Nicolici, Nicola ^b   Veneris, Andreas ^a  

^a UNIVERSITY OF TORONTO   (Canada)

^b MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATED DATA ANALYSIS; DEBUG TECHNIQUES; DESIGN ERRORS; FUNCTIONAL VERIFICATION; RUNTIMES; SILICON DEBUG; SOFTWARE SOLUTION; TEMPORAL DOMAIN; TEST ENVIRONMENT; TEST SEQUENCE;

AUTOMATION; COMPUTER SOFTWARE;

PROGRAM DEBUGGING;

EID: 70350064446     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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