Diagnosing silicon failures based on functional test patterns

Proceedings - International Workshop on Microprocessor Test and Verification

Volumn , Issue , 2006, Pages 94-97

  Yen, Chia Chih ^a   Lin, Ten ^a   Lin, Hermes ^a   Yang, Kai ^b   Liu, Tayung ^b   Hsu, Yu Chin ^b  

^a SpringSoft Inc   (Taiwan)

^b Novas Software Inc   (United States)

Author keywords

Design for debug; Fault diagnosis; Silicon debug

Indexed keywords

FAILURE ANALYSIS; MICROPROCESSOR CHIPS;

DESIGN FOR DEBUG; FUNCTIONAL TEST PATTERNS; INDUSTRIAL CIRCUITS; LOGIC REASONING; ROOT CAUSE IDENTIFICATION; SILICON DEBUG; SYSTEMATIC FRAMEWORK; YIELD IMPROVEMENT;

SILICON;

EID: 46449083793     PISSN: 15504093     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MTV.2006.9     Document Type: Conference Paper

References (7)

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