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Volumn 2005, Issue , 2005, Pages 871-876

Post-verification debugging of hierarchical designs

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; COMPUTATIONAL COMPLEXITY; COMPUTER AIDED DESIGN; COMPUTER SELECTION AND EVALUATION; ERROR DETECTION; PROBLEM SOLVING; PROGRAM DEBUGGING;

EID: 33751398970     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2005.1560184     Document Type: Conference Paper
Times cited : (62)

References (16)
  • 1
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    • Logic verification via test generation
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    • M. S. Abadir, J. Ferguson and T. E. Kirkland, "Logic Verification Via Test Generation", in IEEE Trans. on CAD, vol. 7, pp. 138-148, Jan. 1988.
    • (1988) IEEE Trans. on CAD , vol.7 , pp. 138-148
    • Abadir, M.S.1    Ferguson, J.2    Kirkland, T.E.3
  • 3
    • 0042134647 scopus 로고    scopus 로고
    • Fast pseudo-Boolean constraint solver
    • June
    • D. Chai and A. Kuehlmann, "Fast pseudo-Boolean constraint solver", in Proc. of DAC, pp. 830-835, June 2003.
    • (2003) Proc. of DAC , pp. 830-835
    • Chai, D.1    Kuehlmann, A.2
  • 4
    • 27944433012 scopus 로고    scopus 로고
    • Q-PREZ: QBF evaluation using partition, resolution and elimination with ZBDDs
    • Jan.
    • K. Chandrasekar and M.S. Hsiao, "Q-PREZ: QBF Evaluation Using Partition, Resolution and Elimination with ZBDDs," in Proc. of VLSI Design, pp. 189-194, Jan. 2005.
    • (2005) Proc. of VLSI Design , pp. 189-194
    • Chandrasekar, K.1    Hsiao, M.S.2
  • 10
    • 0026623575 scopus 로고
    • Test pattern generation using boolean satisfiability
    • Jan.
    • T. Larrabee, "Test Pattern Generation Using Boolean Satisfiability," in IEEE Trans. on CAD, vol. 11, no. 1, pp. 4-15, Jan. 1992.
    • (1992) IEEE Trans. on CAD , vol.11 , Issue.1 , pp. 4-15
    • Larrabee, T.1
  • 11
    • 84893813903 scopus 로고    scopus 로고
    • A circuit SAT solver with signal correlation guided learning
    • F. Lu, L.-C. Wang, K.-T. Cheng and R. Y.-Y. Huang, "A Circuit SAT Solver with Signal Correlation Guided Learning," in Proc. of IEEE DATE, pp. 892-897, 2003.
    • (2003) Proc. of IEEE DATE , pp. 892-897
    • Lu, F.1    Wang, L.-C.2    Cheng, K.-T.3    Huang, R.Y.-Y.4
  • 13
    • 84860020525 scopus 로고    scopus 로고
    • OpenCores.org, http://www.opencores.org/.
  • 15
    • 0037230611 scopus 로고    scopus 로고
    • Automatic interconnection rectification for SoC design based on the port order fault model
    • Jan.
    • C.-Y. Wang, S.-W. Tung and J.-Y. Jou, "Automatic Interconnection Rectification for SoC Design Based on the Port Order Fault Model," in IEEE Trans. on CAD, vol. 22, no. 1, pp. 104-114, Jan. 2003.
    • (2003) IEEE Trans. on CAD , vol.22 , Issue.1 , pp. 104-114
    • Wang, C.-Y.1    Tung, S.-W.2    Jou, J.-Y.3
  • 16
    • 0036911945 scopus 로고    scopus 로고
    • Conflict driven learning in a quantified boolean satisfiability solver
    • Nov.
    • L. Zhang and S. Malik, "Conflict Driven Learning in a Quantified Boolean Satisfiability Solver," in Proc. of ICCAD, pp. 442-449, Nov. 2002.
    • (2002) Proc. of ICCAD , pp. 442-449
    • Zhang, L.1    Malik, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.