Deductive technique for diagnosis of bridging faults

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1997, Pages 562-567

  Venkataraman, Srikanth ^a   Fuchs, W Kent ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL CIRCUITS; ELECTRIC FAULT CURRENTS; LOGIC GATES; SEQUENTIAL CIRCUITS;

BRIDGING FAULTS; DEDUCTIVE TECHNIQUES; PATH TRACE PROCEDURES;

COMPUTER AIDED NETWORK ANALYSIS;

EID: 0031378505     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)