Phase retrieval of diffraction patterns from noncrystalline samples using the oversampling method

Physical Review B - Condensed Matter and Materials Physics

Volumn 67, Issue 17, 2003, Pages

  Miao, Jianwei ^a   Ishikawa, Tetsuya ^b   Anderson, Erik H ^c   Hodgson, Keith O ^a  

^a SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^b RIKEN SPring 8 Center   (Japan)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CRYSTAL; ELECTRON DIFFRACTION; IMAGE QUALITY; IMAGE RECONSTRUCTION; NANOPARTICLE; QUANTUM THEORY; SYNCHROTRON; TECHNIQUE; X RAY DIFFRACTION;

EID: 0038236988     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.67.174104     Document Type: Article

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